Membership
Tour
Register
Log in
Igal Lanzet
Follow
Person
K. Bialik, IL
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Wavelength-dependent surface contour measurement system and method
Patent number
6,636,310
Issue date
Oct 21, 2003
Metroptic Technologies, Ltd.
Shimshon Ben-Dov
G01 - MEASURING TESTING
Information
Patent Grant
Stereoscopic sensor
Patent number
6,163,640
Issue date
Dec 19, 2000
Metroptic Technologies, Inc.
Shimshon Ben-Dov
G02 - OPTICS
Information
Patent Grant
Apparatus and method for optically measuring an object surface contour
Patent number
6,094,269
Issue date
Jul 25, 2000
Metroptic Technologies, Ltd.
Shimshon Ben-Dove
G06 - COMPUTING CALCULATING COUNTING