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Haifa, IL
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last 30 patents
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Patent Grant
Method and apparatus for testing IC
Patent number
9,618,569
Issue date
Apr 11, 2017
Marvell Israel (M.I.S.L) Ltd.
Ofer Benjamin
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
METHOD AND APPARATUS FOR TESTING IC
Publication number
20120212246
Publication date
Aug 23, 2012
OFER BENJAMIN
G01 - MEASURING TESTING