Igor Kuperman

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Yokneam, IL

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Patents Grantslast 30 patents

Information Patent Grant
Wavelength-dependent surface contour measurement system and method
- Patent number 6,636,310
- Issue date Oct 21, 2003
- Metroptic Technologies, Ltd.
- Shimshon Ben-Dov
- G01 - MEASURING TESTING
Information Patent Grant
Methods, kits, electrodes and compositions for assessing the level...
- Patent number 6,212,418
- Issue date Apr 3, 2001
- Advanced Monitoring Systems Ltd.
- Irina Even-Tov
- G01 - MEASURING TESTING
Information Patent Grant
Stereoscopic sensor
- Patent number 6,163,640
- Issue date Dec 19, 2000
- Metroptic Technologies, Inc.
- Shimshon Ben-Dov
- G02 - OPTICS
Information Patent Grant
Apparatus and method for optically measuring an object surface contour
- Patent number 6,094,269
- Issue date Jul 25, 2000
- Metroptic Technologies, Ltd.
- Shimshon Ben-Dove
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for assessing drug levels within physiological fl...
- Patent number 6,061,586
- Issue date May 9, 2000
- AMS-Advanced Monitoring Systems Ltd.
- Igor Kuperman
- G01 - MEASURING TESTING