Membership
Tour
Register
Log in
Igor Petrov
Follow
Person
Holon, IL
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Objective lens arrangement
Patent number
11,264,198
Issue date
Mar 1, 2022
Applied Materials Israel Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi mode systems with retractable detectors
Patent number
10,074,513
Issue date
Sep 11, 2018
Applied Materials Israel Ltd.
Alon Litman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device with dynamic focus and method of opera...
Patent number
9,431,210
Issue date
Aug 30, 2016
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for the examination of specimen
Patent number
7,800,062
Issue date
Sep 21, 2010
Applied Materials, Inc.
Alex Goldenshtein
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam system and a method for inspecting a sample
Patent number
7,525,091
Issue date
Apr 28, 2009
Applied Materials, Israel, Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle trap for electrostatic chuck
Patent number
7,317,606
Issue date
Jan 8, 2008
Applied Materials, Israel, Ltd.
Igor Petrov
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Multiple electrode lens arrangement and a method for inspecting an...
Patent number
7,233,008
Issue date
Jun 19, 2007
Applied Materials, Israel, Ltd.
Igor Petrov
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Charged particle beam column and method for directing a charged par...
Patent number
7,223,974
Issue date
May 29, 2007
Applied Materials, Israel, Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for discharging a sample
Patent number
7,170,068
Issue date
Jan 30, 2007
Applied Materials, Israel, Ltd.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Grant
Beam directing system and method for use in a charged particle beam...
Patent number
7,112,803
Issue date
Sep 26, 2006
Applied Materials, Israel, Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam column and method of its operation
Patent number
7,067,807
Issue date
Jun 27, 2006
Applied Materials, Israel, Ltd.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for use in the monitoring of samples with a charg...
Patent number
7,034,297
Issue date
Apr 25, 2006
Applied Materials, Israel, Ltd.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Grant
Objective lens arrangement for use in a charged particle beam column
Patent number
6,897,442
Issue date
May 24, 2005
Applied Materials Israel, Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Deflection method and system for use in a charged particle beam column
Patent number
6,825,475
Issue date
Nov 30, 2004
Applied Materials Israel, Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus and method for inspecting samples
Patent number
6,674,075
Issue date
Jan 6, 2004
Applied Materials, Inc.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Grant
Focusing assembly and method for a charged particle beam column
Patent number
6,380,546
Issue date
Apr 30, 2002
Applied Materials, Inc.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
OBJECTIVE LENS ARRANGEMENT
Publication number
20200118785
Publication date
Apr 16, 2020
APPLIED MATERIALS ISRAEL LTD.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI MODE SYSTEMS WITH RETRACTABLE DETECTORS
Publication number
20170213696
Publication date
Jul 27, 2017
APPLIED MATERIALS ISRAEL LTD.
Alon Litman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERA...
Publication number
20150213998
Publication date
Jul 30, 2015
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE WITH DYNAMIC FOCUS AND METHOD OF OPERA...
Publication number
20130214155
Publication date
Aug 22, 2013
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Dieter Winkler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged particle beam system and a method for inspecting a sample
Publication number
20080073531
Publication date
Mar 27, 2008
APPLIED MATERIALS, ISRAEL, LTD.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for discharging a sample
Publication number
20060255288
Publication date
Nov 16, 2006
Applied Materials Israel Ltd.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Application
Particle trap for electrostatic chuck
Publication number
20060126261
Publication date
Jun 15, 2006
Applied Materials Israel Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged particle beam column and method of its operation
Publication number
20060049348
Publication date
Mar 9, 2006
APPLIED MATERIALS, INC.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Application
Beam directing system and method for use in a charged particle beam...
Publication number
20060016988
Publication date
Jan 26, 2006
Applied Materials Israel Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for the examination of specimen
Publication number
20050116164
Publication date
Jun 2, 2005
Alex Goldenshtein
G01 - MEASURING TESTING
Information
Patent Application
Objective lens arrangement for use in a charged particle beam column
Publication number
20040211913
Publication date
Oct 28, 2004
Applied Materials Israel Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and system for use in the monitoring of samples with a charg...
Publication number
20040173746
Publication date
Sep 9, 2004
Applied Materials Israel Ltd.
Igor Petrov
G01 - MEASURING TESTING
Information
Patent Application
Deflection method and system for use in a charged particle beam column
Publication number
20040056207
Publication date
Mar 25, 2004
Applied Materials Israel Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged particle beam column and method for directing a charged par...
Publication number
20030218133
Publication date
Nov 27, 2003
Applied Materials Israel Ltd.
Igor Petrov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR INSPECTING SAMPLES
Publication number
20030209667
Publication date
Nov 13, 2003
Applied Materials Israel Ltd.
Igor Petrov
G01 - MEASURING TESTING