Igor Rapoport

Follow

Person

Eugene, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for assessing semiconductor structures
- Patent number 11,081,407
- Issue date Aug 3, 2021
- GlobalWafers Co., Ltd.
- Igor Rapoport
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for assessing semiconductor structures
- Patent number 10,490,464
- Issue date Nov 26, 2019
- GlobalWafers Co., Ltd.
- Igor Rapoport
- G01 - MEASURING TESTING
Information Patent Grant
Surface photovoltage calibration standard
- Patent number 9,939,511
- Issue date Apr 10, 2018
- SunEdison Semiconductor Limited
- Igor Rapoport
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
- Publication number 20200058566
- Publication date Feb 20, 2020
- GLOBALWAFERS CO., LTD.
- Igor Rapoport
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR ASSESSING SEMICONDUCTOR STRUCTURES
- Publication number 20180233420
- Publication date Aug 16, 2018
- SunEdison Semiconductor Limited (UEN201334164H)
- Igor Rapoport
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE PHOTOVOLTAGE CALIBRATION STANDARD
- Publication number 20170234960
- Publication date Aug 17, 2017
- SunEdison Semiconductor Limited (UEN201334164H)
- Igor Rapoport
- G01 - MEASURING TESTING