Igor TUROVETS

Person

Moshav Givat Yarim, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Measuring local CD uniformity using scatterometry and machine learning
- Patent number 12,165,023
- Issue date Dec 10, 2024
- Nova Ltd.
- Dexin Kong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring system and method for verifying measurements in patterne...
- Patent number 12,152,869
- Issue date Nov 26, 2024
- Nova Ltd.
- Boaz Brill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure design for metrology measurements in patterned samples
- Patent number 11,639,901
- Issue date May 2, 2023
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method for electrical test prediction
- Patent number 11,335,612
- Issue date May 17, 2022
- Nova Ltd.
- Igor Turovets
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure design for metrology measurements in patterned samples
- Patent number 11,143,601
- Issue date Oct 12, 2021
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for processing patterned structures
- Patent number 10,978,321
- Issue date Apr 13, 2021
- Nova Measuring Instruments Ltd.
- Igor Turovets
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring system and method for verifying measurements in patterne...
- Patent number 10,295,329
- Issue date May 21, 2019
- Nova Measuring Instruments Ltd.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Surface planarization system and method
- Patent number 10,226,852
- Issue date Mar 12, 2019
- Nova Measuring Instruments Ltd.
- Igor Turovets
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure for use in metrology measurements of patterns
- Patent number 10,216,098
- Issue date Feb 26, 2019
- Nova Measuring Instruments Ltd.
- Oded Cohen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical metrology for in-situ measurements
- Patent number 10,197,506
- Issue date Feb 5, 2019
- Nova Measuring Instruments Ltd.
- Igor Turovets
- G01 - MEASURING TESTING
Information Patent Grant
Test structures and metrology technique utilizing the test structur...
- Patent number 10,066,936
- Issue date Sep 4, 2018
- Nova Measuring Instruments Ltd.
- Igor Turovets
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology for in-situ measurements
- Patent number 9,915,624
- Issue date Mar 13, 2018
- Nova Measuring Instruments, Ltd.
- Igor Turovets
- G01 - MEASURING TESTING
Information Patent Grant
Optical metrology for in-situ measurements
- Patent number 9,528,946
- Issue date Dec 27, 2016
- Nova Measuring Instruments Ltd.
- Igor Turovets
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Imaging metrology
- Publication number 20230280283
- Publication date Sep 7, 2023
- NOVA LTD.
- Igor TUROVETS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING LOCAL CD UNIFORMITY USING SCATTEROMETRY AND MACHINE LEARNING
- Publication number 20230131932
- Publication date Apr 27, 2023
- NOVA LTD
- Dexin KONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Monitoring system and method for verifying measurements in pattened...
- Publication number 20220163320
- Publication date May 26, 2022
- NOVA LTD
- Boaz Brill
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES
- Publication number 20220099596
- Publication date Mar 31, 2022
- NOVA LTD
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES
- Publication number 20200057005
- Publication date Feb 20, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
AN APPARATUS AND METHOD FOR ELECTRICAL TEST PREDICTION
- Publication number 20200006165
- Publication date Jan 2, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- IGOR TUROVETS
- G11 - INFORMATION STORAGE
Information Patent Application
MONITORING SYSTEM AND METHOD FOR VERIFYING MEASUREMENTS IN PATTENED...
- Publication number 20190339056
- Publication date Nov 7, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR PROCESSING PATTERNED STRUCTURES
- Publication number 20190027386
- Publication date Jan 24, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Igor TUROVETS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS
- Publication number 20180195975
- Publication date Jul 12, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Igor Turovets
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PLANARIZATION SYSTEM AND METHOD
- Publication number 20180029189
- Publication date Feb 1, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Igor TUROVETS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE FOR USE IN METROLOGY MEASUREMENTS OF PATTERNS
- Publication number 20170363970
- Publication date Dec 21, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Oded COHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS
- Publication number 20170167987
- Publication date Jun 15, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Igor Turovets
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES
- Publication number 20170146465
- Publication date May 25, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURES AND METROLOGY TECHNIQUE UTILIZING THE TEST STRUCTUR...
- Publication number 20170023357
- Publication date Jan 26, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Igor TUROVETS
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PLANARIZATION SYSTEM AND METHOD
- Publication number 20160318148
- Publication date Nov 3, 2016
- NOVA MEASURING INSTRUMENTS LTD.
- Igor TUROVETS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS
- Publication number 20150226680
- Publication date Aug 13, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Igor Turovets
- G01 - MEASURING TESTING
Information Patent Application
Monitoring system and method for verifying measurements in patterne...
- Publication number 20140195194
- Publication date Jul 10, 2014
- NOVA MEASURING INSTRUMENTS LTD.
- Boaz Brill
- G01 - MEASURING TESTING

Igor TUROVETS

Person

Patents Grantslast 30 patents

Measuring local CD uniformity using scatterometry and machine learning

Monitoring system and method for verifying measurements in patterne...

Test structure design for metrology measurements in patterned samples

Apparatus and method for electrical test prediction

Test structure design for metrology measurements in patterned samples

Method and system for processing patterned structures

Monitoring system and method for verifying measurements in patterne...

Surface planarization system and method

Test structure for use in metrology measurements of patterns

Optical metrology for in-situ measurements

Test structures and metrology technique utilizing the test structur...

Optical metrology for in-situ measurements

Optical metrology for in-situ measurements

Patents Applicationslast 30 patents

Imaging metrology

MEASURING LOCAL CD UNIFORMITY USING SCATTEROMETRY AND MACHINE LEARNING

Monitoring system and method for verifying measurements in pattened...

TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES

TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES

AN APPARATUS AND METHOD FOR ELECTRICAL TEST PREDICTION

MONITORING SYSTEM AND METHOD FOR VERIFYING MEASUREMENTS IN PATTENED...

METHOD AND SYSTEM FOR PROCESSING PATTERNED STRUCTURES

OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS

SURFACE PLANARIZATION SYSTEM AND METHOD

TEST STRUCTURE FOR USE IN METROLOGY MEASUREMENTS OF PATTERNS

OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS

TEST STRUCTURE DESIGN FOR METROLOGY MEASUREMENTS IN PATTERNED SAMPLES

TEST STRUCTURES AND METROLOGY TECHNIQUE UTILIZING THE TEST STRUCTUR...

SURFACE PLANARIZATION SYSTEM AND METHOD

OPTICAL METROLOGY FOR IN-SITU MEASUREMENTS

Monitoring system and method for verifying measurements in patterne...