Igor Volfman

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Characterization of micromirror array devices using interferometers
- Patent number 7,557,932
- Issue date Jul 7, 2009
- Texas Instruments Incorporated
- Jonathan Doan
- G02 - OPTICS
Information Patent Grant
Performance analyses of micromirror devices
- Patent number 7,483,126
- Issue date Jan 27, 2009
- Texas Instruments Incorporated
- Igor Volfman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Performance Analyses of Micromirror Devices
- Publication number 20090190825
- Publication date Jul 30, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Igor Volfman
- G01 - MEASURING TESTING
Information Patent Application
Characterization of micromirror array devices using interferometers
- Publication number 20060245032
- Publication date Nov 2, 2006
- Jonathan Doan
- G02 - OPTICS
Information Patent Application
Performance analyses of micromirror devices
- Publication number 20050286045
- Publication date Dec 29, 2005
- Igor Volfman
- G01 - MEASURING TESTING