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Ijaz Jafri
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Holliston, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Sensing device
Patent number
11,725,941
Issue date
Aug 15, 2023
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Amir Rahafrooz
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and method of manufacturing thereof
Patent number
11,358,858
Issue date
Jun 14, 2022
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Amir Rahafrooz
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method and apparatus for electrostatic mode-alignment on planar MEM...
Patent number
10,082,394
Issue date
Sep 25, 2018
Panasonic Corporation
Amir Rahafrooz
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR ACOUSTICALLY ISOLATED RESONATORS
Publication number
20240077312
Publication date
Mar 7, 2024
Panasonic Intellectual Property Management Co., Ltd.
Diego EMILIO SERRANO
G01 - MEASURING TESTING
Information
Patent Application
SENSING DEVICE
Publication number
20220316881
Publication date
Oct 6, 2022
Panasonic Intellectual Property Management Co., Ltd.
Amir RAHAFROOZ
G01 - MEASURING TESTING
Information
Patent Application
SENSING DEVICE
Publication number
20220107181
Publication date
Apr 7, 2022
Panasonic Intellectual Property Management Co., Ltd.
Amir RAHAFROOZ
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THEREOF
Publication number
20210229978
Publication date
Jul 29, 2021
Panasonic Intellectual Property Management Co., Ltd.
Amir RAHAFROOZ
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Method and Apparatus for Electrostatic Mode-Alignment on Planar MEM...
Publication number
20160349055
Publication date
Dec 1, 2016
QUALTRE, INC.
Amir Rahafrooz
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DECOUPLING ENVIRONMENTAL AND MODAL DEPENDE...
Publication number
20160327390
Publication date
Nov 10, 2016
QUALTRE, INC.
Diego E. Serrano
G01 - MEASURING TESTING