Ikseon Jeon

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method using same
- Patent number 11,946,881
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe for detecting near field and near-field detecting system incl...
- Patent number 11,579,168
- Issue date Feb 14, 2023
- Samsung Electronics Co., Ltd.
- Ikseon Jeon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER
- Publication number 20240234216
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Inkeun BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20240230528
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER
- Publication number 20240136232
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Inkeun BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE AND INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20240019362
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Junbum Park
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ PROBE
- Publication number 20230417820
- Publication date Dec 28, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD USING SAME
- Publication number 20220412898
- Publication date Dec 29, 2022
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTING SYSTEM INCL...
- Publication number 20220155340
- Publication date May 19, 2022
- Samsung Electronics Co., Ltd.
- Ikseon Jeon
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS OF WAFER
- Publication number 20210366102
- Publication date Nov 25, 2021
- Samsung Electronics Co., Ltd.
- Suhwan PARK
- G06 - COMPUTING CALCULATING COUNTING

Ikseon Jeon

Person

Patents Grantslast 30 patents

Inspection apparatus and inspection method using same

Probe for detecting near field and near-field detecting system incl...

Patents Applicationslast 30 patents

METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER

TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD

METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER

PROBE AND INSPECTION APPARATUS INCLUDING THE SAME

TERAHERTZ PROBE

INSPECTION APPARATUS AND INSPECTION METHOD USING SAME

PROBE FOR DETECTING NEAR FIELD AND NEAR-FIELD DETECTING SYSTEM INCL...

INSPECTION APPARATUS OF WAFER