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Ikuko Nakatani
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Chiba-shi, JP
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last 30 patents
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Patent Grant
Sample preparing device and sample posture shifting method
Patent number
8,198,603
Issue date
Jun 12, 2012
SII NanoTechnology Inc.
Haruo Takahashi
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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Patent Application
METHOD AND APPARATUS FOR PREPARING LAMELLA
Publication number
20130175446
Publication date
Jul 11, 2013
SII NANOTECHNOLOGY INC.
Ikuko NAKATANI
G01 - MEASURING TESTING
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Patent Application
Sample preparing device and sample posture shifting method
Publication number
20090114842
Publication date
May 7, 2009
Haruo Takahashi
H01 - BASIC ELECTRIC ELEMENTS