Ikuko NAKATANI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Thin-sample-piece fabricating device and thin-sample-piece fabricat...
- Patent number 11,199,480
- Issue date Dec 14, 2021
- Hitachi High-Tech Science Corporation
- Ikuko Nakatani
- G01 - MEASURING TESTING
Information Patent Grant
Method of preparing thin film sample piece and charged particle bea...
- Patent number 11,094,503
- Issue date Aug 17, 2021
- Hitachi High-Tech Science Corporation
- Masato Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing lamella
- Patent number 9,595,420
- Issue date Mar 14, 2017
- Hitachi High-Tech Science Corporation
- Ikuko Nakatani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,455,119
- Issue date Sep 27, 2016
- Hitachi High-Tech Science Corporation
- Makoto Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TEM sample preparation method
- Patent number 9,315,898
- Issue date Apr 19, 2016
- Hitachi High-Tech Science Corporation
- Hidekazu Suzuki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Focused ion beam apparatus and method of working sample using the same
- Patent number 9,310,325
- Issue date Apr 12, 2016
- Hitachi High-Tech Science Corporation
- Ikuko Nakatani
- G01 - MEASURING TESTING
Information Patent Grant
Sample preparation method
- Patent number 9,260,782
- Issue date Feb 16, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
THIN-SAMPLE-PIECE FABRICATING DEVICE AND THIN-SAMPLE-PIECE FABRICAT...
- Publication number 20200300736
- Publication date Sep 24, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ikuko NAKATANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PREPARING THIN FILM SAMPLE PIECE AND CHARGED PARTICLE BEA...
- Publication number 20200266031
- Publication date Aug 20, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masato SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150270096
- Publication date Sep 24, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Makoto SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM APPARATUS AND METHOD OF WORKING SAMPLE USING THE SAME
- Publication number 20140291512
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ikuko NAKATANI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PREPARATION METHOD
- Publication number 20130251914
- Publication date Sep 26, 2013
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
TEM SAMPLE PREPARATION METHOD
- Publication number 20130209700
- Publication date Aug 15, 2013
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hidekazu SUZUKI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Ikuko NAKATANI

Person

Patents Grantslast 30 patents

Thin-sample-piece fabricating device and thin-sample-piece fabricat...

Method of preparing thin film sample piece and charged particle bea...

Method for preparing lamella

Charged particle beam apparatus

TEM sample preparation method

Focused ion beam apparatus and method of working sample using the same

Sample preparation method

Patents Applicationslast 30 patents

THIN-SAMPLE-PIECE FABRICATING DEVICE AND THIN-SAMPLE-PIECE FABRICAT...

METHOD OF PREPARING THIN FILM SAMPLE PIECE AND CHARGED PARTICLE BEA...

CHARGED PARTICLE BEAM APPARATUS

FOCUSED ION BEAM APPARATUS AND METHOD OF WORKING SAMPLE USING THE SAME

SAMPLE PREPARATION METHOD

TEM SAMPLE PREPARATION METHOD