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Ikuo Kawaguchi
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Tokyo, JP
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last 30 patents
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Patent Grant
Semiconductor device structure
Patent number
5,811,877
Issue date
Sep 22, 1998
Hitachi, Ltd.
Ichiro Miyano
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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Patent Application
Optical module testing method and testing system
Publication number
20030081278
Publication date
May 1, 2003
OpNext Japan, Inc.
Norio Chujo
H04 - ELECTRIC COMMUNICATION TECHNIQUE