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Ikuo OGASAWARA

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  • Nirasaki-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe apparatus
    • Patent number 9,658,285
    • Issue date May 23, 2017
    • Tokyo Electron Limited
    • Isao Kouno
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card for power device
    • Patent number 9,322,844
    • Issue date Apr 26, 2016
    • Tokyo Electron Limited
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Carrier supporting apparatus
    • Patent number 8,678,739
    • Issue date Mar 25, 2014
    • Tokyo Electron Limited
    • Ikuo Ogasawara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Substrate attracting device and substrate transfer apparatus
    • Patent number 8,196,983
    • Issue date Jun 12, 2012
    • Tokyo Electron Limited
    • Munetoshi Nagasaka
    • Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Information Patent Grant

    Wafer attracting plate
    • Patent number D609652
    • Issue date Feb 9, 2010
    • Tokyo Electron Limited
    • Munetoshi Nagasaka
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Wafer holding member
    • Patent number D589912
    • Issue date Apr 7, 2009
    • Tokyo Electron Limited
    • Ikuo Ogasawara
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Wafer holding member
    • Patent number D589474
    • Issue date Mar 31, 2009
    • Tokyo Electron Limited
    • Ikuo Ogasawara
    • D13 - Equipment for production, distribution, or transformation of energy
  • Information Patent Grant

    Wafer chuck
    • Patent number 7,411,384
    • Issue date Aug 12, 2008
    • Tokyo Electron Limited
    • Ikuo Ogasawara
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE CARD FOR POWER DEVICE
    • Publication number 20140176173
    • Publication date Jun 26, 2014
    • TOKYO ELECTRON LIMITED
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20130063171
    • Publication date Mar 14, 2013
    • TOKYO ELECTRON LIMITED
    • Isao Kouno
    • G01 - MEASURING TESTING
  • Information Patent Application

    Carrier Supporting Apparatus
    • Publication number 20090245979
    • Publication date Oct 1, 2009
    • Ikuo Ogasawara
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SUBSTRATE ATTRACTING DEVICE AND SUBSTRATE TRANSFER APPARATUS
    • Publication number 20080267741
    • Publication date Oct 30, 2008
    • TOKYO ELECTRON LIMITED
    • Munetoshi NAGASAKA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    WAFER CHUCK
    • Publication number 20070152691
    • Publication date Jul 5, 2007
    • TOKYO ELECTRON LIMITED
    • Ikuo OGASAWARA
    • G01 - MEASURING TESTING