Ikuo WAKAYAMA

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Hirakata-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Light scattering measuring apparatus and measuring jig
- Patent number 12,174,103
- Issue date Dec 24, 2024
- Otsuka Electronics Co., Ltd.
- Yusuke Izutani
- G01 - MEASURING TESTING
Information Patent Grant
Zeta-potential measurement jig
- Patent number 11,953,465
- Issue date Apr 9, 2024
- Otsuka Electronics Co., Ltd.
- Hiroya Nagasawa
- G01 - MEASURING TESTING
Information Patent Grant
Particle size measurement method, particle size measurement apparat...
- Patent number 11,598,713
- Issue date Mar 7, 2023
- Otsuka Electronics Co., Ltd.
- Ikuo Wakayama
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer
- Patent number D962096
- Issue date Aug 30, 2022
- Otsuka Electronics Co., Ltd.
- Sayaka Obana
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Optical measurement apparatus, and optical measurement method
- Patent number 10,788,412
- Issue date Sep 29, 2020
- Otsuka Electronics Co., Ltd.
- Yusuke Izutani
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer
- Patent number D869310
- Issue date Dec 10, 2019
- Otsuka Electronics Co., Ltd.
- Hiroya Nagasawa
- D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

Information Patent Application
LIGHT SCATTERING MEASURING APPARATUS AND MEASURING JIG
- Publication number 20220155203
- Publication date May 19, 2022
- Otsuka Electronics Co., Ltd.
- Yusuke IZUTANI
- G01 - MEASURING TESTING
Information Patent Application
ZETA-POTENTIAL MEASUREMENT JIG
- Publication number 20210325340
- Publication date Oct 21, 2021
- OTSUKA ELECTRONICS CO., LTD.
- Hiroya NAGASAWA
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE SIZE MEASUREMENT METHOD, PARTICLE SIZE MEASUREMENT APPARAT...
- Publication number 20210310929
- Publication date Oct 7, 2021
- OTSUKA ELECTRONICS CO., LTD.
- Ikuo WAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS, AND OPTICAL MEASUREMENT METHOD
- Publication number 20190011351
- Publication date Jan 10, 2019
- Otsuka Electronics Co., Ltd.
- Yusuke IZUTANI
- G01 - MEASURING TESTING