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Il Jin
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Chungcheongnam-do, KR
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last 30 patents
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Patent Grant
Vacuum socket and semiconductor testing system including the same
Patent number
9,958,500
Issue date
May 1, 2018
Samsung Electronics Co., Ltd.
Jang-Sun Kim
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
VACUUM SOCKET AND SEMICONDUCTOR TESTING SYSTEM INCLUDING THE SAME
Publication number
20170010324
Publication date
Jan 12, 2017
Samsung Electronics Co., Ltd.
Jang-Sun Kim
G01 - MEASURING TESTING