Ilan BEN-HARUSH

Person

Tel- Aviv, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Examination of a hole formed in a semiconductor specimen
- Patent number 12,347,734
- Issue date Jul 1, 2025
- Applied Materials Israel Ltd.
- Rafael Bistritzer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control of a manufacturing process using contour curvature analysis...
- Patent number 12,299,868
- Issue date May 13, 2025
- Applied Materials Israel Ltd.
- Einat Frishman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of defects using a computationally efficient segmentation...
- Patent number 12,272,042
- Issue date Apr 8, 2025
- Applied Materials Israel Ltd.
- Elad Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Local shape deviation in a semiconductor specimen
- Patent number 11,686,571
- Issue date Jun 27, 2023
- Applied Materials Israel Ltd.
- Roman Kris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating a metrology recipe usable for examination of a semicondu...
- Patent number 11,443,420
- Issue date Sep 13, 2022
- Applied Materials Israel Ltd.
- Roman Kris
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...
- Publication number 20250225642
- Publication date Jul 10, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Einat FRISHMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION OF AN EXAMINATION SYSTEM
- Publication number 20250183001
- Publication date Jun 5, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED METROLOGY FOR SEMICONDUCTOR SPECIMENS
- Publication number 20250004386
- Publication date Jan 2, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ilan BEN-HARUSH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUC...
- Publication number 20240428395
- Publication date Dec 26, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXAMINATION OF A HOLE FORMED IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230420308
- Publication date Dec 28, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...
- Publication number 20230230223
- Publication date Jul 20, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Einat FRISHMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION OF DEFECTS USING A COMPUTATIONALLY EFFICIENT SEGMENTATION...
- Publication number 20230206417
- Publication date Jun 29, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Elad COHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOCAL SHAPE DEVIATION IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230069303
- Publication date Mar 2, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A PORTABLE DEVICE AND AN APPARATUS FOR REPLACING USED BATTERY OF TH...
- Publication number 20220278377
- Publication date Sep 1, 2022
- Moshe AMZALEG
- G07 - CHECKING-DEVICES
Information Patent Application
GENERATING A METROLOGY RECIPE USABLE FOR EXAMINATION OF A SEMICONDU...
- Publication number 20220207681
- Publication date Jun 30, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G06 - COMPUTING CALCULATING COUNTING

Ilan BEN-HARUSH

Person

Patents Grantslast 30 patents

Examination of a hole formed in a semiconductor specimen

Control of a manufacturing process using contour curvature analysis...

Detection of defects using a computationally efficient segmentation...

Local shape deviation in a semiconductor specimen

Generating a metrology recipe usable for examination of a semicondu...

Patents Applicationslast 30 patents

STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...

CALIBRATION OF AN EXAMINATION SYSTEM

MACHINE LEARNING BASED METROLOGY FOR SEMICONDUCTOR SPECIMENS

OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUC...

EXAMINATION OF A HOLE FORMED IN A SEMICONDUCTOR SPECIMEN

STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...

DETECTION OF DEFECTS USING A COMPUTATIONALLY EFFICIENT SEGMENTATION...

LOCAL SHAPE DEVIATION IN A SEMICONDUCTOR SPECIMEN

A PORTABLE DEVICE AND AN APPARATUS FOR REPLACING USED BATTERY OF TH...

GENERATING A METROLOGY RECIPE USABLE FOR EXAMINATION OF A SEMICONDU...