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Ilia Tomski
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Concord, CA
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Patents Grants
last 30 patents
Information
Patent Grant
High sensitivity mass spectrometer interface for multiple ion sources
Patent number
8,008,619
Issue date
Aug 30, 2011
Ionics Mass Spectrometry Group
Charles Jolliffe
G01 - MEASURING TESTING
Information
Patent Grant
Concentrating mass spectrometer ion guide, spectrometer and method
Patent number
7,932,488
Issue date
Apr 26, 2011
Gholamreza Javahery
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer ion guide providing axial field, and method
Patent number
7,868,289
Issue date
Jan 11, 2011
Ionics Mass Spectrometry Group Inc.
Lisa Cousins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High sensitivity mass spectrometer interface for multiple ion sources
Patent number
7,687,771
Issue date
Mar 30, 2010
Ionics Mass Spectrometry Group
Charles Jolliffe
G01 - MEASURING TESTING
Information
Patent Grant
Concentrating mass spectrometer ion guide, spectrometer and method
Patent number
7,569,811
Issue date
Aug 4, 2009
Ionics Mass Spectrometry Group Inc.
Gholamreza Javahery
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for separation of isobaric interferences
Patent number
7,439,498
Issue date
Oct 21, 2008
Albert Edward Litherland
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MASS SPECTROMETER ION GUIDE PROVIDING AXIAL FIELD, AND METHOD
Publication number
20110133079
Publication date
Jun 9, 2011
Lisa Cousins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High sensitivity mass spectrometer interface for multiple ion sources
Publication number
20100148059
Publication date
Jun 17, 2010
IONICS MASS SPECTROMETRY GROUP
Charles Jolliffe
G01 - MEASURING TESTING
Information
Patent Application
CONCENTRATING MASS SPECTROMETER ION GUIDE, SPECTROMETER AND METHOD
Publication number
20090218484
Publication date
Sep 3, 2009
Ionics Mass Spectrometry Group Inc.
Gholamreza Javahery
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETER ION GUIDE PROVIDING AXIAL FIELD, AND METHOD
Publication number
20080265154
Publication date
Oct 30, 2008
Ionics Mass Spectrometry Inc.
Lisa Cousins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High sensitivity mass spectrometer interface for multiple ion sources
Publication number
20070181800
Publication date
Aug 9, 2007
Charles Jolliffe
G01 - MEASURING TESTING
Information
Patent Application
Concentrating mass spectrometer ion guide, spectrometer and method
Publication number
20070164213
Publication date
Jul 19, 2007
Ionics Mass Spectrometry Group Inc.
Gholamreza Javahery
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for separation of isobaric interferences
Publication number
20060113464
Publication date
Jun 1, 2006
Albert Edward Litherland
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL