Ilya Chizhov

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Oakland, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Fast wafer positioning method for optical metrology
- Patent number 7,030,984
- Issue date Apr 18, 2006
- Therma-Wave, Inc.
- Martin Ebert
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for finding the center of rotation of an R-theta...
- Patent number 6,747,746
- Issue date Jun 8, 2004
- Therma-Wave, Inc.
- Ilya Chizhov
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fast wafer positioning method for optical metrology
- Publication number 20040027572
- Publication date Feb 12, 2004
- Martin Ebert
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System for providing communication between a GUI and metrology cont...
- Publication number 20030093164
- Publication date May 15, 2003
- Martin Ebert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Graphical user interface for sample positioning
- Publication number 20030081216
- Publication date May 1, 2003
- Martin Ebert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for finding the center of rotation of an R-theta...
- Publication number 20030025919
- Publication date Feb 6, 2003
- Ilya Chizhov
- G01 - MEASURING TESTING