Ilya Rubinovich

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Rehovot, IL

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Patents Grantslast 30 patents

Information Patent Grant
Metrology and process control for semiconductor manufacturing
- Patent number 11,093,840
- Issue date Aug 17, 2021
- Nova Measuring Instruments Ltd.
- Eitan Rothstein
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20210150387
- Publication date May 20, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- EITAN ROTHSTEIN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DATA CARRIER WITH REFERENCE LAYER
- Publication number 20100290332
- Publication date Nov 18, 2010
- Mempile Inc.
- Andrew Shipway
- G11 - INFORMATION STORAGE
Information Patent Application
Multi-Layer Three Dimensional Non-Linear Optical Data Carrier and M...
- Publication number 20080291810
- Publication date Nov 27, 2008
- Mempile Inc. c/o PHS Corporate Services, Inc.
- Ortal Alpert
- G11 - INFORMATION STORAGE