Ilyoung Kim

Person

Plainsboro, NJ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test and self-repair methods and devices for computer...
- Patent number 6,397,349
- Issue date May 28, 2002
- Agere Systems Guardian Corp.
- Frank P. Higgins
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for detecting faults in computer memories using a...
- Patent number 6,317,846
- Issue date Nov 13, 2001
- Agere Systems Guardian Corp.
- Frank P. Higgins
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test controlled by a token network and method
- Patent number 6,237,123
- Issue date May 22, 2001
- Lucent Technologies Inc.
- Ilyoung Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for testing multiport memories
- Patent number 6,216,241
- Issue date Apr 10, 2001
- Agere Systems Guardian Corp.
- Larry Ray Fenstermaker
- G11 - INFORMATION STORAGE
Information Patent Grant
Optimized built-in self-test method and apparatus for random access...
- Patent number 6,205,564
- Issue date Mar 20, 2001
- Lucent Technologies Inc.
- Ilyoung Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for detecting faults in multiple computer memories
- Patent number 6,175,936
- Issue date Jan 16, 2001
- Lucent Technologies Inc.
- Frank P. Higgins
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing method and apparatus for first-in first-out memories
- Patent number 6,108,802
- Issue date Aug 22, 2000
- Lucent Technologies Inc.
- Ilyoung Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for built-in self-testing of ring-address FIFOs having a dat...
- Patent number 5,978,935
- Issue date Nov 2, 1999
- Ilyoung Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test in a plurality of stages controlled by a token p...
- Patent number 5,978,947
- Issue date Nov 2, 1999
- Lucent Technologies Inc.
- Ilyoung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing large embedded counters
- Patent number 5,473,651
- Issue date Dec 5, 1995
- AT&T Corp.
- Miroslaw Guzinski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-fully-decoded test address generator
- Patent number 5,420,870
- Issue date May 30, 1995
- AT&T Corp.
- Ilyoung Kim
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Built-in self-test hierarchy for an integrated circuit
- Publication number 20040128600
- Publication date Jul 1, 2004
- Ilyoung Kim
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN-SELF-TEST AND SELF-REPAIR METHODS AND DEVICES FOR COMPUTER...
- Publication number 20020019957
- Publication date Feb 14, 2002
- AGERE SYSTEMS GUARDIAN CORP.
- FRANK P. HIGGINS
- G11 - INFORMATION STORAGE

Ilyoung Kim

Person

Patents Grantslast 30 patents

Built-in self-test and self-repair methods and devices for computer...

System and method for detecting faults in computer memories using a...

Built-in self-test controlled by a token network and method

Method and system for testing multiport memories

Optimized built-in self-test method and apparatus for random access...

Apparatus for detecting faults in multiple computer memories

Testing method and apparatus for first-in first-out memories

Method for built-in self-testing of ring-address FIFOs having a dat...

Built-in self-test in a plurality of stages controlled by a token p...

Method and apparatus for testing large embedded counters

Non-fully-decoded test address generator

Patents Applicationslast 30 patents

Built-in self-test hierarchy for an integrated circuit

BUILT-IN-SELF-TEST AND SELF-REPAIR METHODS AND DEVICES FOR COMPUTER...