Iman ABDALI MASHHADI

Person

Kanata, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer testing for current property of a power transistor
- Patent number 12,352,801
- Issue date Jul 8, 2025
- Infineon Technologies Canada Inc.
- Iman Abdali Mashhadi
- G01 - MEASURING TESTING
Information Patent Grant
Control driver circuit and method for power transistor
- Patent number 12,218,653
- Issue date Feb 4, 2025
- Infineon Technologies Canada Inc.
- Iman Abdali Mashhadi
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC MAVERICK WAFER SCREENING USING DIE PASS PATTERN
- Publication number 20250172503
- Publication date May 29, 2025
- Infineon Technologies Canada Inc.
- Iman ABDALI MASHHADI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC MAVERICK WAFER SCREENING USING MEASURED DIE PARAMETER AGA...
- Publication number 20250172607
- Publication date May 29, 2025
- Infineon Technologies Canada Inc.
- Iman ABDALI MASHHADI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE BIASING FOR A TRANSISTOR STRUCTURE THAT USES A TWO-DIMENS...
- Publication number 20250133762
- Publication date Apr 24, 2025
- Infineon Technologies Canada Inc.
- Iman ABDALI MASHHADI
Information Patent Application
MONOLITHIC STRUCTURE FOR SUBSTRATE BIASING FOR A TRANSISTOR THAT US...
- Publication number 20250133837
- Publication date Apr 24, 2025
- Infineon Technologies Canada Inc.
- Iman ABDALI MASHHADI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR
- Publication number 20250020712
- Publication date Jan 16, 2025
- GAN SYSTEMS INC.
- Iman ABDALI MASHHADI
- G01 - MEASURING TESTING
Information Patent Application
CONTROL DRIVER CIRCUIT AND METHOD FOR POWER TRANSISTOR
- Publication number 20240333275
- Publication date Oct 3, 2024
- GAN SYSTEMS INC.
- Iman Abdali Mashhadi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SELECTIVE GATE OVERDRIVE OF TRANSISTOR
- Publication number 20240297230
- Publication date Sep 5, 2024
- GAN SYSTEMS INC.
- Seyedarmin MIREMAD
- H01 - BASIC ELECTRIC ELEMENTS

Iman ABDALI MASHHADI

Person

Patents Grantslast 30 patents

Wafer testing for current property of a power transistor

Control driver circuit and method for power transistor

Patents Applicationslast 30 patents

AUTOMATIC MAVERICK WAFER SCREENING USING DIE PASS PATTERN

AUTOMATIC MAVERICK WAFER SCREENING USING MEASURED DIE PARAMETER AGA...

SUBSTRATE BIASING FOR A TRANSISTOR STRUCTURE THAT USES A TWO-DIMENS...

MONOLITHIC STRUCTURE FOR SUBSTRATE BIASING FOR A TRANSISTOR THAT US...

WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR

CONTROL DRIVER CIRCUIT AND METHOD FOR POWER TRANSISTOR

SELECTIVE GATE OVERDRIVE OF TRANSISTOR