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Patents Grantslast 30 patents

Information Patent Grant
Probe head scanning probe microscope including the same
- Patent number 8,689,360
- Issue date Apr 1, 2014
- Samsung Electronics Co., Ltd.
- In-su Jeon
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR MEASURING STATIC ELECTRICITY AND METHOD FOR MEASURING...
- Publication number 20140375652
- Publication date Dec 25, 2014
- SAMSUNG DISPLAY CO., LTD.
- In Su Jeon
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD SCANNING PROBE MICROSCOPE INCLUDING THE SAME
- Publication number 20130111635
- Publication date May 2, 2013
- Samsung Electronics Co., Ltd.
- In-su JEON
- B82 - NANO-TECHNOLOGY