Ingi KIM

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Polarization measuring device and method of fabricating semiconduct...
- Patent number 11,946,809
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Ingi Kim
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection apparatus and system including the same
- Patent number 11,823,927
- Issue date Nov 21, 2023
- Samsung Electronics Co., Ltd.
- Kyunghun Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection system and method of manufacturing semiconduct...
- Patent number 11,823,961
- Issue date Nov 21, 2023
- Samsung Electronics Co., Ltd.
- Eunhee Jeang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device including foldable conductive plate
- Patent number 11,425,833
- Issue date Aug 23, 2022
- Samsung Electronics Co., Ltd.
- Wooktae Kim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Cleaning apparatus, chemical mechanical polishing system including...
- Patent number 10,388,537
- Issue date Aug 20, 2019
- Samsung Electronics Co., Ltd.
- Chae Lyoung Kim
- B24 - GRINDING POLISHING
Information Patent Grant
Substrate treating apparatus
- Patent number 10,186,427
- Issue date Jan 22, 2019
- Samsung Electronics Co., Ltd.
- Kyoung Hwan Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate treating apparatus and method of treating substrate
- Patent number 9,852,921
- Issue date Dec 26, 2017
- Samsung Electronics Co., Ltd.
- Kyoung Hwan Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE
- Publication number 20250035563
- Publication date Jan 30, 2025
- Samsung Electronics Co., Ltd.
- Ryuju Sato
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PROCESSING APPARATUS USING PLASMA
- Publication number 20250014871
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Sungwon CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATERIAL MEASUREMENT SYSTEM AND METHOD
- Publication number 20250003734
- Publication date Jan 2, 2025
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240288265
- Publication date Aug 29, 2024
- Samsung Electronics Co., Ltd.
- Jinyong Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER
- Publication number 20240234216
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Inkeun BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20240230528
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING APPARATUS AND TESTING APPARATUS HAVING THE SAME
- Publication number 20240183777
- Publication date Jun 6, 2024
- Samsung Electronics Co., Ltd.
- Yasuhiro HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING SURFACE OF OBJECT
- Publication number 20240183796
- Publication date Jun 6, 2024
- Samsung Electronics Co., Ltd.
- YASUHIRO HIDAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20240145315
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- EUNHEE JEANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER
- Publication number 20240136232
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Inkeun BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE
- Publication number 20230125628
- Publication date Apr 27, 2023
- Samsung Electronics Co., Ltd.
- Shinji UEYAMA
- G11 - INFORMATION STORAGE
Information Patent Application
POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCT...
- Publication number 20230068376
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Ingi KIM
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE COMPRISING TRANSPARENT COVER INCLUDING GLASS AND...
- Publication number 20230042280
- Publication date Feb 9, 2023
- Samsung Electronics Co., Ltd.
- Wooktae KIM
- B32 - LAYERED PRODUCTS
Information Patent Application
PARTICLE INSPECTION DEVICE BASED ON SPATIAL MODULATION METHOD AND P...
- Publication number 20220120662
- Publication date Apr 21, 2022
- Samsung Electronics Co., Ltd.
- Sangwoo BAE
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION APPARATUS AND SYSTEM INCLUDING THE SAME
- Publication number 20220068681
- Publication date Mar 3, 2022
- Samsung Electronics Co., Ltd.
- Kyunghun Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20210305106
- Publication date Sep 30, 2021
- Samsung Electronics Co., Ltd.
- EUNHEE JEANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANING APPARATUS, CHEMICAL MECHANICAL POLISHING SYSTEM INCLUDING...
- Publication number 20210098261
- Publication date Apr 1, 2021
- Samsung Electronics Co., Ltd.
- Chae Lyoung KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE INCLUDING FOLDABLE CONDUCTIVE PLATE
- Publication number 20210029841
- Publication date Jan 28, 2021
- Samsung Electronics Co., Ltd.
- Wooktae KIM
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CLEANING APPARATUS, CHEMICAL MECHANICAL POLISHING SYSTEM INCLUDING...
- Publication number 20180315613
- Publication date Nov 1, 2018
- Samsung Electronics Co., Ltd.
- Chae Lyoung KIM
- B24 - GRINDING POLISHING
Information Patent Application
CLEANING COMPOSITION, CLEANING APPARATUS, AND METHOD FOR MANUFACTUR...
- Publication number 20180151395
- Publication date May 31, 2018
- Samsung Electronics Co., Ltd.
- MIHYUN PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE TREATING APPARATUS
- Publication number 20180096856
- Publication date Apr 5, 2018
- Samsung Electronics Co., Ltd.
- Kyoung Hwan KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANING APPARATUS, CHEMICAL MECHANICAL POLISHING SYSTEM INCLUDING...
- Publication number 20170301553
- Publication date Oct 19, 2017
- Samsung Electronics Co., Ltd.
- Chae Lyoung KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE TREATING APPARATUS AND METHOD OF TREATING SUBSTRATE
- Publication number 20170062287
- Publication date Mar 2, 2017
- Samsung Electronics Co., Ltd.
- Kyoung Hwan KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID CHEMICAL SUPPLYING SYSTEM, SUBSTRATE PROCESSING SYSTEM, AND...
- Publication number 20160368030
- Publication date Dec 22, 2016
- Samsung Electronics Co., Ltd.
- Ingi KIM
- B08 - CLEANING

Person

Patents Grantslast 30 patents

Polarization measuring device and method of fabricating semiconduct...

Wafer inspection apparatus and system including the same

Substrate inspection system and method of manufacturing semiconduct...

Electronic device including foldable conductive plate

Cleaning apparatus, chemical mechanical polishing system including...

Substrate treating apparatus

Substrate treating apparatus and method of treating substrate

Patents Applicationslast 30 patents

SEMICONDUCTOR MEASUREMENT DEVICE

SEMICONDUCTOR PROCESSING APPARATUS USING PLASMA

MATERIAL MEASUREMENT SYSTEM AND METHOD

SEMICONDUCTOR MEASUREMENT APPARATUS

METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER

TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD

MEASURING APPARATUS AND TESTING APPARATUS HAVING THE SAME

APPARATUS FOR INSPECTING SURFACE OF OBJECT

SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...

METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER

INSPECTION DEVICE

POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCT...

ELECTRONIC DEVICE COMPRISING TRANSPARENT COVER INCLUDING GLASS AND...

PARTICLE INSPECTION DEVICE BASED ON SPATIAL MODULATION METHOD AND P...

WAFER INSPECTION APPARATUS AND SYSTEM INCLUDING THE SAME

SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...

CLEANING APPARATUS, CHEMICAL MECHANICAL POLISHING SYSTEM INCLUDING...

ELECTRONIC DEVICE INCLUDING FOLDABLE CONDUCTIVE PLATE

CLEANING APPARATUS, CHEMICAL MECHANICAL POLISHING SYSTEM INCLUDING...

CLEANING COMPOSITION, CLEANING APPARATUS, AND METHOD FOR MANUFACTUR...

SUBSTRATE TREATING APPARATUS

CLEANING APPARATUS, CHEMICAL MECHANICAL POLISHING SYSTEM INCLUDING...

SUBSTRATE TREATING APPARATUS AND METHOD OF TREATING SUBSTRATE

LIQUID CHEMICAL SUPPLYING SYSTEM, SUBSTRATE PROCESSING SYSTEM, AND...