Ingo Bork

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for forming patterns using charged particle beam...
- Patent number 10,031,413
- Issue date Jul 24, 2018
- D2S, Inc.
- Akira Fujimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for design of enhanced edge slope patterns for ch...
- Patent number 9,612,530
- Issue date Apr 4, 2017
- D2S, Inc.
- Akira Fujimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for forming patterns with charged particle beam l...
- Patent number 9,465,297
- Issue date Oct 11, 2016
- D2S, Inc.
- Akira Fujimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for forming patterns using charged particle beam...
- Patent number 9,400,857
- Issue date Jul 26, 2016
- D2S, Inc.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for forming non-manhattan patterns using variable...
- Patent number 9,164,372
- Issue date Oct 20, 2015
- D2S, Inc.
- Akira Fujimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for forming non-manhattan patterns using variable...
- Patent number 9,091,946
- Issue date Jul 28, 2015
- D2S, Inc.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for design of enhanced edge slope patterns for ch...
- Patent number 9,057,956
- Issue date Jun 16, 2015
- D2S, Inc.
- Akira Fujimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for forming high accuracy patterns using charged...
- Patent number 9,043,734
- Issue date May 26, 2015
- D2S, Inc.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for forming patterns with charged particle beam l...
- Patent number 9,034,542
- Issue date May 19, 2015
- D2S, Inc.
- Akira Fujimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for forming patterns using charged particle beam...
- Patent number 8,719,739
- Issue date May 6, 2014
- D2S, Inc.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for forming patterns with charged particle beam l...
- Patent number 8,703,389
- Issue date Apr 22, 2014
- D2S, Inc.
- Akira Fujimura
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method and system for forming high accuracy patterns using charged...
- Patent number 8,473,875
- Issue date Jun 25, 2013
- D2S, Inc.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR FORMING PATTERNS WITH CHARGED PARTICLE BEAM L...
- Publication number 20170023862
- Publication date Jan 26, 2017
- D2S, INC.
- Akira Fujimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR FORMING PATTERNS USING CHARGED PARTICLE BEAM...
- Publication number 20160334700
- Publication date Nov 17, 2016
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Design of Enhanced Edge Slope Patterns for Ch...
- Publication number 20160195805
- Publication date Jul 7, 2016
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Design of Enhanced Edge Slope Patterns for Ch...
- Publication number 20150338737
- Publication date Nov 26, 2015
- D2S, INC.
- Akira Fujimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR FORMING PATTERNS WITH CHARGED PARTICLE BEAM L...
- Publication number 20150261907
- Publication date Sep 17, 2015
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Forming Non-Manhattan Patterns Using Variable...
- Publication number 20150104737
- Publication date Apr 16, 2015
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR FORMING PATTERNS WITH CHARGED PARTICLE BEAM L...
- Publication number 20140229904
- Publication date Aug 14, 2014
- D2S, INC.
- Akira Fujimura
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and System for Forming High Accuracy Patterns Using Charged...
- Publication number 20140223393
- Publication date Aug 7, 2014
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Forming Non-Manhattan Patterns Using Variable...
- Publication number 20130306884
- Publication date Nov 21, 2013
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR FORMING PATTERNS USING CHARGED PARTICLE BEAM...
- Publication number 20130283219
- Publication date Oct 24, 2013
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR FORMING PATTERNS USING CHARGED PARTICLE BEAM...
- Publication number 20130283217
- Publication date Oct 24, 2013
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR FORMING PATTERNS USING CHARGED PARTICLE BEAM...
- Publication number 20130283218
- Publication date Oct 24, 2013
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR DESIGN OF ENHANCED ACCURACY PATTERNS FOR CHAR...
- Publication number 20130252143
- Publication date Sep 26, 2013
- D2S, INC.
- Akira Fujimura
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and System for Forming Patterns with Charged Particle Beam L...
- Publication number 20120329289
- Publication date Dec 27, 2012
- D2S, INC.
- Akira Fujimura
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND SYSTEM FOR FORMING NON-MANHATTAN PATTERNS USING VARIABLE...
- Publication number 20120278770
- Publication date Nov 1, 2012
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR DESIGN OF ENHANCED EDGE SLOPE PATTERNS FOR CH...
- Publication number 20120221981
- Publication date Aug 30, 2012
- D2S, INC.
- Akira Fujimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR DESIGN OF ENHANCED ACCURACY PATTERNS FOR CHAR...
- Publication number 20120221980
- Publication date Aug 30, 2012
- D2S, INC.
- Akira Fujimura
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and System for Forming High Accuracy Patterns Using Charged...
- Publication number 20120096412
- Publication date Apr 19, 2012
- D2S, INC.
- Akira Fujimura
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Method and system for forming patterns using charged particle beam...

Method and system for design of enhanced edge slope patterns for ch...

Method and system for forming patterns with charged particle beam l...

Method and system for forming patterns using charged particle beam...

Method and system for forming non-manhattan patterns using variable...

Method and system for forming non-manhattan patterns using variable...

Method and system for design of enhanced edge slope patterns for ch...

Method and system for forming high accuracy patterns using charged...

Method and system for forming patterns with charged particle beam l...

Method and system for forming patterns using charged particle beam...

Method and system for forming patterns with charged particle beam l...

Method and system for forming high accuracy patterns using charged...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR FORMING PATTERNS WITH CHARGED PARTICLE BEAM L...

METHOD AND SYSTEM FOR FORMING PATTERNS USING CHARGED PARTICLE BEAM...

Method and System for Design of Enhanced Edge Slope Patterns for Ch...

Method and System for Design of Enhanced Edge Slope Patterns for Ch...

METHOD AND SYSTEM FOR FORMING PATTERNS WITH CHARGED PARTICLE BEAM L...

Method and System for Forming Non-Manhattan Patterns Using Variable...

METHOD AND SYSTEM FOR FORMING PATTERNS WITH CHARGED PARTICLE BEAM L...

Method and System for Forming High Accuracy Patterns Using Charged...

Method and System for Forming Non-Manhattan Patterns Using Variable...

METHOD AND SYSTEM FOR FORMING PATTERNS USING CHARGED PARTICLE BEAM...

METHOD AND SYSTEM FOR FORMING PATTERNS USING CHARGED PARTICLE BEAM...

METHOD AND SYSTEM FOR FORMING PATTERNS USING CHARGED PARTICLE BEAM...

METHOD AND SYSTEM FOR DESIGN OF ENHANCED ACCURACY PATTERNS FOR CHAR...

Method and System for Forming Patterns with Charged Particle Beam L...

METHOD AND SYSTEM FOR FORMING NON-MANHATTAN PATTERNS USING VARIABLE...

METHOD AND SYSTEM FOR DESIGN OF ENHANCED EDGE SLOPE PATTERNS FOR CH...

METHOD AND SYSTEM FOR DESIGN OF ENHANCED ACCURACY PATTERNS FOR CHAR...

Method and System for Forming High Accuracy Patterns Using Charged...