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Ingo Schmitz
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Santa Barbara, CA, US
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last 30 patents
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Patent Grant
Scanning probe microscopy method and apparatus utilizing sample pitch
Patent number
7,429,732
Issue date
Sep 30, 2008
Veeco Instruments Inc.
David A. Kneeburg
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Scanning probe microscopy method and apparatus utilizing sample pitch
Publication number
20070075243
Publication date
Apr 5, 2007
David A. Kneeburg
G01 - MEASURING TESTING