Ingolf Menn

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Dargun, DE

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Patents Grantslast 30 patents

Information Patent Grant
Spatial filter measuring arrangement, device, and associated method...
- Patent number 8,987,657
- Issue date Mar 24, 2015
- Micro-Epsilon Optronic GmbH
- Martin Degner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Microarray-Based Spatial Filter
- Publication number 20130001401
- Publication date Jan 3, 2013
- MICRO-EPSILON OPTRONIC GMBH
- Martin Degner
- G01 - MEASURING TESTING