Ingrid B. Peterson

Person

Menlo Park, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for detecting defects in a reticle design pattern
- Patent number 8,213,704
- Issue date Jul 3, 2012
- KLA-Tencor Corp.
- Ingrid B. Peterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computer-implemented methods for detecting and/or sorting defects i...
- Patent number 8,111,900
- Issue date Feb 7, 2012
- KLA-Tencor Technologies Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Dual-mode robot systems and methods for electronic device manufactu...
- Patent number 8,078,304
- Issue date Dec 13, 2011
- Applied Materials, Inc.
- Michael R. Rice
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and systems for detecting defects in a reticle design pattern
- Patent number 7,769,225
- Issue date Aug 3, 2010
- KLA-Tencor Technologies Corp.
- Sagar A. Kekare
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods for detecting and/or sorting defects i...
- Patent number 7,729,529
- Issue date Jun 1, 2010
- KLA-Tencor Technologies Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Qualifying patterns, patterning processes, or patterning apparatus...
- Patent number 7,418,124
- Issue date Aug 26, 2008
- KLA-Tencor Technologies Corp.
- Ingrid B. Peterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Qualifying patterns, patterning processes, or patterning apparatus...
- Patent number 6,902,855
- Issue date Jun 7, 2005
- KLA Tencor Technologies
- Ingrid B. Peterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER-IMPLEMENTED METHODS FOR DETECTING AND/OR SORTING DEFECTS I...
- Publication number 20100226562
- Publication date Sep 9, 2010
- KLA-Tencor Technologies Corporation
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
THREE DIMENSIONAL PACKAGING WITH WAFER-LEVEL BONDING AND CHIP-LEVEL...
- Publication number 20090130821
- Publication date May 21, 2009
- Applied Materials, Inc.
- Damon K. Cox
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL-MODE ROBOT SYSTEMS AND METHODS FOR ELECTRONIC DEVICE MANUFACTU...
- Publication number 20090024241
- Publication date Jan 22, 2009
- Applied Materials, Inc.
- Michael R. Rice
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS IN A RETICLE DESIGN PATTERN
- Publication number 20090016595
- Publication date Jan 15, 2009
- Ingrid B. Peterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods and systems for detecting defects in a reticle design pattern
- Publication number 20070035728
- Publication date Feb 15, 2007
- Sagar A. Kekare
- G01 - MEASURING TESTING
Information Patent Application
Computer-implemented methods for detecting and/or sorting defects i...
- Publication number 20060291714
- Publication date Dec 28, 2006
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
Qualifying patterns, patterning processes, or patterning apparatus...
- Publication number 20040091142
- Publication date May 13, 2004
- Ingrid B. Peterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Qualifying patterns, patterning processes, or patterning apparatus...
- Publication number 20040009416
- Publication date Jan 15, 2004
- Ingrid B. Peterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Ingrid B. Peterson

Person

Patents Grantslast 30 patents

Methods and systems for detecting defects in a reticle design pattern

Computer-implemented methods for detecting and/or sorting defects i...

Dual-mode robot systems and methods for electronic device manufactu...

Methods and systems for detecting defects in a reticle design pattern

Computer-implemented methods for detecting and/or sorting defects i...

Qualifying patterns, patterning processes, or patterning apparatus...

Qualifying patterns, patterning processes, or patterning apparatus...

Patents Applicationslast 30 patents

COMPUTER-IMPLEMENTED METHODS FOR DETECTING AND/OR SORTING DEFECTS I...

THREE DIMENSIONAL PACKAGING WITH WAFER-LEVEL BONDING AND CHIP-LEVEL...

DUAL-MODE ROBOT SYSTEMS AND METHODS FOR ELECTRONIC DEVICE MANUFACTU...

METHODS AND SYSTEMS FOR DETECTING DEFECTS IN A RETICLE DESIGN PATTERN

Methods and systems for detecting defects in a reticle design pattern

Computer-implemented methods for detecting and/or sorting defects i...

Qualifying patterns, patterning processes, or patterning apparatus...

Qualifying patterns, patterning processes, or patterning apparatus...