Inka Zienert

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
System and method for estimating the crystallinity of stacked metal...
- Patent number 7,718,447
- Issue date May 18, 2010
- Advanced Micro Devices, Inc.
- Inka Zienert
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining an orientation of a crystal lattice of a firs...
- Patent number 7,421,060
- Issue date Sep 2, 2008
- Advanced Micro Devices, Inc.
- Inka Zienert
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DETERMINING AN ORIENTATION OF A CRYSTAL LATTICE OF A FIRS...
- Publication number 20080056449
- Publication date Mar 6, 2008
- Inka Zienert
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ESTIMATING THE CRYSTALLINITY OF STACKED METAL...
- Publication number 20070201615
- Publication date Aug 30, 2007
- Inka Zienert
- G01 - MEASURING TESTING