InKyo Kim

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Cupertino, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Automatic selection of sample values for optical metrology
- Patent number 10,895,810
- Issue date Jan 19, 2021
- KLA Corporation
- Meng Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Secondary target design for optical measurements
- Patent number 9,311,431
- Issue date Apr 12, 2016
- KLA-Tencor Corporation
- Sungchul Yoo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC SELECTION OF SAMPLE VALUES FOR OPTICAL METROLOGY
- Publication number 20150142395
- Publication date May 21, 2015
- Meng Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Secondary Target Design for Optical Measurements
- Publication number 20130116978
- Publication date May 9, 2013
- KLA-TENCOR CORPORATION
- Sungchul Yoo
- G01 - MEASURING TESTING