Ioan Sturzu

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Houston, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Beam tomography systems and methods
- Patent number 12,147,003
- Issue date Nov 19, 2024
- Z Terra, Inc.
- Nicolay Tanushev
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction imaging systems and methods using specularity gathers
- Patent number 10,324,204
- Issue date Jun 18, 2019
- Z TERRA INC.
- Ioan Sturzu
- G01 - MEASURING TESTING
Information Patent Grant
Time migration diffraction imaging systems and methods
- Patent number 9,726,771
- Issue date Aug 8, 2017
- Z TERRA INC.
- Alexander M. Popovici
- G01 - MEASURING TESTING
Information Patent Grant
Fast beam migration using plane-wave destructor (PWD) beam forming
- Patent number 9,594,176
- Issue date Mar 14, 2017
- Z TERRA INC.
- Alexander M. Popovici
- G01 - MEASURING TESTING