Iraj Emami

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Scanner optimization for reduced across-chip performance variation...
- Patent number 7,460,922
- Issue date Dec 2, 2008
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Transistor gate shape metrology using multiple data sources
- Patent number 7,373,215
- Issue date May 13, 2008
- Advanced Micro Devices, Inc.
- Jason Phillip Cain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing critical dimension uniformity utilizing a resist bake pl...
- Patent number 7,334,202
- Issue date Feb 19, 2008
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Composite alignment mark scheme for multi-layers in lithography
- Patent number 7,221,060
- Issue date May 22, 2007
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Real time immersion medium control using scatterometry
- Patent number 7,158,896
- Issue date Jan 2, 2007
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Use of contamination-free manufacturing data in fault detection and...
- Patent number 6,560,504
- Issue date May 6, 2003
- Advanced Micro Devices, Inc.
- Thomas J. Goodwin
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Drop-in test structure and methodology for characterizing an integr...
- Patent number 6,452,412
- Issue date Sep 17, 2002
- Advanced Micro Devices, Inc.
- Richard W. Jarvis
- G01 - MEASURING TESTING
Information Patent Grant
Multipurpose defect test structure with switchable voltage contrast...
- Patent number 6,297,644
- Issue date Oct 2, 2001
- Advanced Micro Devices, Inc.
- Richard W. Jarvis
- G01 - MEASURING TESTING
Information Patent Grant
Drop-in test structure and abbreviated integrated circuit process f...
- Patent number 6,294,397
- Issue date Sep 25, 2001
- Advanced Micro Devices, Inc.
- Richard W. Jarvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor test structure with intentional partial defects and m...
- Patent number 6,268,717
- Issue date Jul 31, 2001
- Advanced Micro Devices, Inc.
- Richard W. Jarvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fractal filter applied to a contamination-free manufacturing signal...
- Patent number 6,242,273
- Issue date Jun 5, 2001
- Advanced Micro Devices, Inc.
- Thomas J. Goodwin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TRANSISTOR GATE SHAPE METROLOGY USING MULTIPLE DATA SOURCES
- Publication number 20080058978
- Publication date Mar 6, 2008
- Advanced Micro Devices, Inc.
- Jason Phillip Cain
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Scanner optimization for reduced across-chip performance variation...

Transistor gate shape metrology using multiple data sources

Optimizing critical dimension uniformity utilizing a resist bake pl...

Composite alignment mark scheme for multi-layers in lithography

Real time immersion medium control using scatterometry

Use of contamination-free manufacturing data in fault detection and...

Drop-in test structure and methodology for characterizing an integr...

Multipurpose defect test structure with switchable voltage contrast...

Drop-in test structure and abbreviated integrated circuit process f...

Semiconductor test structure with intentional partial defects and m...

Fractal filter applied to a contamination-free manufacturing signal...

Patents Applicationslast 30 patents

TRANSISTOR GATE SHAPE METROLOGY USING MULTIPLE DATA SOURCES