Irfan Malik

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for detecting defects on a reticle
- Patent number 8,041,106
- Issue date Oct 18, 2011
- KLA-Tencor Corp.
- Patrick Tung-Sing Pak
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PLASMA PROCESS CONTROL USING FLUORINE RADICAL CONCENTRATIONS
- Publication number 20250132139
- Publication date Apr 24, 2025
- Applied Materials, Inc.
- Hari Ponnekanti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REMOTE ACCESS, CONTROL, AND MANAGEMENT OF A POWER MICRO GRID
- Publication number 20150311721
- Publication date Oct 29, 2015
- NUEVO POWER, INC.
- Sanjay UPPAL
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS ON A RETICLE
- Publication number 20100142800
- Publication date Jun 10, 2010
- KLA-Tencor Corporation
- Patrick Tung-Sing Pak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Determining Information about Defects or Binning Defects Detected o...
- Publication number 20070280526
- Publication date Dec 6, 2007
- Irfan Malik
- G06 - COMPUTING CALCULATING COUNTING