Iris Wong

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Folsom, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Measuring and identifying analog characteristics of a microelectron...
- Patent number 7,705,620
- Issue date Apr 27, 2010
- Intel Corporation
- Mukul Kelkar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measuring and identifying analog characteristics of a microelectron...
- Publication number 20070229106
- Publication date Oct 4, 2007
- Mukul Kelkar
- G01 - MEASURING TESTING