Isaac Daniel Buzaglo

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Migdal Ha'emek, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for classifying defects in wafer using wafer-defe...
- Patent number 12,020,417
- Issue date Jun 25, 2024
- Camtek Ltd.
- Isaac Daniel Buzaglo
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFE...
- Publication number 20240289945
- Publication date Aug 29, 2024
- CAMTEK LTD
- Isaac Daniel Buzaglo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFE...
- Publication number 20210334946
- Publication date Oct 28, 2021
- CAMTEK LTD
- Isaac Daniel Buzaglo
- G06 - COMPUTING CALCULATING COUNTING