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Isaac J. Landa
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Wheaton, MD, US
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last 30 patents
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Patent Grant
Holographic diffraction grating system for rapid scan spectral anal...
Patent number
4,285,596
Issue date
Aug 25, 1981
Neotec Corporation
Isaac J. Landa
G01 - MEASURING TESTING
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Patent Grant
Rapid scan spectral analysis system utilizing higher order spectral...
Patent number
4,264,205
Issue date
Apr 28, 1981
Neotec Corporation
Isaac J. Landa
G01 - MEASURING TESTING