Isaac Mazor

Person

Haifa, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Closed-loop control of X-ray knife edge
- Patent number 10,386,313
- Issue date Aug 20, 2019
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of small features using XRF
- Patent number 9,829,448
- Issue date Nov 28, 2017
- BRUKER JV ISRAEL LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source assembly
- Patent number 9,666,322
- Issue date May 30, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for accurately determining the thickness and/or elemental co...
- Patent number 9,632,043
- Issue date Apr 25, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray scatterometry apparatus
- Patent number 9,606,073
- Issue date Mar 28, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)
- Patent number 9,551,677
- Issue date Jan 24, 2017
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection of bumps on a semiconductor substrate
- Patent number 9,390,984
- Issue date Jul 12, 2016
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Estimation of XRF intensity from an array of micro-bumps
- Patent number 9,389,192
- Issue date Jul 12, 2016
- BRUKER JV ISRAEL LTD.
- Alex Tokar
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,731,138
- Issue date May 20, 2014
- Jordan Valley Semiconductor Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Combining X-ray and VUV analysis of thin film layers
- Patent number 8,565,379
- Issue date Oct 22, 2013
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,243,878
- Issue date Aug 14, 2012
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Accurate measurement of layer dimensions using XRF
- Patent number 7,804,934
- Issue date Sep 28, 2010
- Jordan Valley Semiconductors Ltd.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of small features using X-ray fluorescence
- Patent number 7,653,174
- Issue date Jan 26, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Automated selection of X-ray reflectometry measurement locations
- Patent number 7,649,978
- Issue date Jan 19, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Multifunction X-ray analysis system
- Patent number 7,551,719
- Issue date Jun 23, 2009
- Jordan Valley Semiconductord Ltd
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Overlay metrology using X-rays
- Patent number 7,481,579
- Issue date Jan 27, 2009
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement of properties of thin films on sidewalls
- Patent number 7,483,513
- Issue date Jan 27, 2009
- Jordan Valley Semiconductors, Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Control of X-ray beam spot size
- Patent number 7,453,985
- Issue date Nov 18, 2008
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Detection of dishing and tilting using X-ray fluorescence
- Patent number 7,245,695
- Issue date Jul 17, 2007
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Efficient measurement of diffuse X-ray reflections
- Patent number 7,231,016
- Issue date Jun 12, 2007
- Jordan Valley Applied Radiation, Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Combined X-ray reflectometer and diffractometer
- Patent number 7,120,228
- Issue date Oct 10, 2006
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing resolution of X-ray measurements by sample motion
- Patent number 7,113,566
- Issue date Sep 26, 2006
- Jordan Valley Applied Radiation Ltd.
- Asher Peled
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of critical dimensions using X-ray diffraction in refle...
- Patent number 7,110,491
- Issue date Sep 19, 2006
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Enhancement of X-ray reflectometry by measurement of diffuse reflec...
- Patent number 7,068,753
- Issue date Jun 27, 2006
- Jordan Valley Applied Radiation Ltd.
- David Berman
- G01 - MEASURING TESTING
Information Patent Grant
Optical alignment of X-ray microanalyzers
- Patent number 7,023,954
- Issue date Apr 4, 2006
- Jordan Valley Applied Radiation Ltd.
- Tzachi Rafaeli
- G01 - MEASURING TESTING
Information Patent Grant
Beam centering and angle calibration for X-ray reflectometry
- Patent number 6,947,520
- Issue date Sep 20, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Dual-wavelength x-ray monochromator
- Patent number 6,907,108
- Issue date Jun 14, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
XRR detector readout processing
- Patent number 6,895,071
- Issue date May 17, 2005
- Jordon Valley Applied Radiation, Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Dual-wavelength X-ray reflectometry
- Patent number 6,680,996
- Issue date Jan 20, 2004
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of critical dimensions using X-rays
- Patent number 6,556,652
- Issue date Apr 29, 2003
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Closed-loop control of X-ray knife edge
- Publication number 20180088062
- Publication date Mar 29, 2018
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF SMALL FEATURES USING XRF
- Publication number 20160123909
- Publication date May 5, 2016
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCATTEROMETRY APPARATUS
- Publication number 20150369759
- Publication date Dec 24, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ACCURATELY DETERMINING THE THICKNESS AND/OR ELEMENTAL CO...
- Publication number 20150330921
- Publication date Nov 19, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SOURCE ASSEMBLY
- Publication number 20150243469
- Publication date Aug 27, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANGLE CALIBRATION FOR GRAZING-INCIDENCE X-RAY FLUORESCENCE (GIXRF)
- Publication number 20150204806
- Publication date Jul 23, 2015
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATION OF XRF INTENSITY FROM AN ARRAY OF MICRO-BUMPS
- Publication number 20140286473
- Publication date Sep 25, 2014
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Alex Tokar
- G01 - MEASURING TESTING
Information Patent Application
X-ray inspection of bumps on a semiconductor substrate
- Publication number 20130089178
- Publication date Apr 11, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20120281814
- Publication date Nov 8, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Combining X-ray and VUV Analysis of Thin Film Layers
- Publication number 20120275568
- Publication date Nov 1, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20110164730
- Publication date Jul 7, 2011
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Automated selection of x-ray reflectometry measurement locations
- Publication number 20090074141
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF
- Publication number 20090074137
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Dileep Agnihotri
- G01 - MEASURING TESTING
Information Patent Application
Inspection of small features using X-Ray fluorescence
- Publication number 20080159475
- Publication date Jul 3, 2008
- JORDAN VALLEY SEMICONDUCTORS
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Control of X-ray beam spot size
- Publication number 20080043914
- Publication date Feb 21, 2008
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Automated selection of X-ray reflectometry measurement locations
- Publication number 20070274447
- Publication date Nov 29, 2007
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Overlay metrology using X-rays
- Publication number 20070224518
- Publication date Sep 27, 2007
- Boris Yokhin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Measurement of properties of thin films on sidewalls
- Publication number 20060274886
- Publication date Dec 7, 2006
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Detection of dishing and tilting using x-ray fluorescence
- Publication number 20060227931
- Publication date Oct 12, 2006
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Efficient measurement of diffuse X-ray reflections
- Publication number 20060182220
- Publication date Aug 17, 2006
- David Berman
- G01 - MEASURING TESTING
Information Patent Application
Measurement of critical dimensions using X-ray diffraction in refle...
- Publication number 20060133570
- Publication date Jun 22, 2006
- JORDAN VALLEY APPLIED RADIATION LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Multifunction X-ray analysis system
- Publication number 20060062351
- Publication date Mar 23, 2006
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Combined X-ray reflectometer and diffractometer
- Publication number 20060062350
- Publication date Mar 23, 2006
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Enhancement of X-ray reflectometry by measurement of diffuse reflec...
- Publication number 20060023836
- Publication date Feb 2, 2006
- David Berman
- G01 - MEASURING TESTING
Information Patent Application
Optical alignment of X-ray microanalyzers
- Publication number 20050069090
- Publication date Mar 31, 2005
- JORDAN VALLEY APPLIED RADIATION LTD.
- Tzachi Rafaeli
- G01 - MEASURING TESTING
Information Patent Application
Dual-wavelength x-ray monochromator
- Publication number 20040151278
- Publication date Aug 5, 2004
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Beam centering and angle calibration for X-ray reflectometry
- Publication number 20040109531
- Publication date Jun 10, 2004
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
X-ray reflectometer
- Publication number 20040028186
- Publication date Feb 12, 2004
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Dual-wavelength X-ray reflectometry
- Publication number 20030156682
- Publication date Aug 21, 2003
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
X-ray reflectometer
- Publication number 20030072413
- Publication date Apr 17, 2003
- Boris Yokhin
- G01 - MEASURING TESTING

Isaac Mazor

Person

Patents Grantslast 30 patents

Closed-loop control of X-ray knife edge

Measurement of small features using XRF

X-ray source assembly

Method for accurately determining the thickness and/or elemental co...

X-ray scatterometry apparatus

Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)

X-ray inspection of bumps on a semiconductor substrate

Estimation of XRF intensity from an array of micro-bumps

High-resolution X-ray diffraction measurement with enhanced sensiti...

Combining X-ray and VUV analysis of thin film layers

High-resolution X-ray diffraction measurement with enhanced sensiti...

Accurate measurement of layer dimensions using XRF

Inspection of small features using X-ray fluorescence

Automated selection of X-ray reflectometry measurement locations

Multifunction X-ray analysis system

Overlay metrology using X-rays

Measurement of properties of thin films on sidewalls

Control of X-ray beam spot size

Detection of dishing and tilting using X-ray fluorescence

Efficient measurement of diffuse X-ray reflections

Combined X-ray reflectometer and diffractometer

Enhancing resolution of X-ray measurements by sample motion

Measurement of critical dimensions using X-ray diffraction in refle...

Enhancement of X-ray reflectometry by measurement of diffuse reflec...

Optical alignment of X-ray microanalyzers

Beam centering and angle calibration for X-ray reflectometry

Dual-wavelength x-ray monochromator

XRR detector readout processing

Dual-wavelength X-ray reflectometry

Measurement of critical dimensions using X-rays

Patents Applicationslast 30 patents

Closed-loop control of X-ray knife edge

MEASUREMENT OF SMALL FEATURES USING XRF

X-RAY SCATTEROMETRY APPARATUS

METHOD FOR ACCURATELY DETERMINING THE THICKNESS AND/OR ELEMENTAL CO...

X-RAY SOURCE ASSEMBLY

ANGLE CALIBRATION FOR GRAZING-INCIDENCE X-RAY FLUORESCENCE (GIXRF)

ESTIMATION OF XRF INTENSITY FROM AN ARRAY OF MICRO-BUMPS

X-ray inspection of bumps on a semiconductor substrate

High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...

Combining X-ray and VUV Analysis of Thin Film Layers

High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...

Automated selection of x-ray reflectometry measurement locations

ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF

Inspection of small features using X-Ray fluorescence

Control of X-ray beam spot size

Automated selection of X-ray reflectometry measurement locations

Overlay metrology using X-rays

Measurement of properties of thin films on sidewalls

Detection of dishing and tilting using x-ray fluorescence

Efficient measurement of diffuse X-ray reflections

Measurement of critical dimensions using X-ray diffraction in refle...

Multifunction X-ray analysis system

Combined X-ray reflectometer and diffractometer

Enhancement of X-ray reflectometry by measurement of diffuse reflec...

Optical alignment of X-ray microanalyzers

Dual-wavelength x-ray monochromator

Beam centering and angle calibration for X-ray reflectometry

X-ray reflectometer

Dual-wavelength X-ray reflectometry

X-ray reflectometer