Isamu Inomata

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Nirasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Prober for inspecting semiconductor devices formed on semiconductor...
- Patent number 9,684,014
- Issue date Jun 20, 2017
- Tokyo Electron Limited
- Shuji Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 9,261,553
- Issue date Feb 16, 2016
- Tokyo Electron Limited
- Eiichi Shinohara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method for inspecting electric characteristics of device...
- Patent number 8,536,891
- Issue date Sep 17, 2013
- Tokyo Electron Limited
- Yasuhito Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method for inspecting electric characteris...
- Patent number 8,081,007
- Issue date Dec 20, 2011
- Tokyo Electron Limited
- Yasuhito Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Contact load measuring apparatus and inspecting apparatus
- Patent number 7,688,096
- Issue date Mar 30, 2010
- Tokyo Electron Limited
- Isamu Inomata
- G01 - MEASURING TESTING
Information Patent Grant
Probing method and probing system
- Patent number 6,433,566
- Issue date Aug 13, 2002
- Tokyo Electron Limited
- Isao Kono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBER
- Publication number 20150226767
- Publication date Aug 13, 2015
- TOKYO ELECTRON LIMITED
- Shuji Akiyama
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS
- Publication number 20150028907
- Publication date Jan 29, 2015
- TOKYO ELECTRON LIMITED
- Eiichi Shinohara
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR INSPECTING ELECTRIC CHARACTERISTICS OF DEVICE...
- Publication number 20110309849
- Publication date Dec 22, 2011
- TOKYO ELECTRON LIMITED
- Yasuhito Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20090058446
- Publication date Mar 5, 2009
- TOKYO ELECTRON LIMITED
- Yasuhito Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Contact load measuring apparatus and inspecting apparatus
- Publication number 20090039903
- Publication date Feb 12, 2009
- TOKYO ELECTRON LIMITED
- Isamu Inomata
- G01 - MEASURING TESTING