Isamu Sekihara

Person

Fusa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and sample preparation method
- Patent number 9,362,088
- Issue date Jun 7, 2016
- Hitachi High-Technologies Corporation
- Takahiro Sato
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 9,330,883
- Issue date May 3, 2016
- Hitachi High-Technologies Corporation
- Terutaka Nanri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, position specification method used fo...
- Patent number 8,912,487
- Issue date Dec 16, 2014
- Hitachi High-Technologies Corporation
- Kunio Sakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam device and focused ion beam processing method
- Patent number 8,552,397
- Issue date Oct 8, 2013
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam apparatus, and sample processing and observat...
- Patent number 8,455,824
- Issue date Jun 4, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection apparatus
- Patent number 7,989,766
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Refilling method by ion beam, instrument for fabrication and observ...
- Patent number 7,709,062
- Issue date May 4, 2010
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Probe driving method, and probe apparatus
- Patent number 7,301,146
- Issue date Nov 27, 2007
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting defects of devices and method of inspectin...
- Patent number 6,970,004
- Issue date Nov 29, 2005
- Hitachi, Ltd.
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Probe driving method, and probe apparatus
- Patent number 6,960,765
- Issue date Nov 1, 2005
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting defect in device and method of detecting de...
- Patent number 6,734,687
- Issue date May 11, 2004
- Hitachi, Ltd.
- Tohru Ishitani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device and Sample Preparation Method
- Publication number 20150255250
- Publication date Sep 10, 2015
- Hitachi High-Technologies Corporation
- Takahiro Sato
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20150014529
- Publication date Jan 15, 2015
- Hitachi High-Technologies Corporation
- Terutaka Nanri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD OF IRRADIATING CHARGED P...
- Publication number 20130248733
- Publication date Sep 26, 2013
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...
- Publication number 20120326028
- Publication date Dec 27, 2012
- Hiroyuki MUTO
- G01 - MEASURING TESTING
Information Patent Application
Focused Ion Beam Device and Focused Ion Beam Processing Method
- Publication number 20120235055
- Publication date Sep 20, 2012
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Charged Particle Beam Device, Position Specification Method Used fo...
- Publication number 20120211652
- Publication date Aug 23, 2012
- Kunio Sakamoto
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION APPARATUS
- Publication number 20090250610
- Publication date Oct 8, 2009
- Hitachi High-Technologies Corporation
- Yasuhiko NARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...
- Publication number 20090020698
- Publication date Jan 22, 2009
- Hitachi High-Technologies Corporation
- Hiroyuki MUTO
- G01 - MEASURING TESTING
Information Patent Application
Probe driving method, and probe apparatus
- Publication number 20050269511
- Publication date Dec 8, 2005
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for inspecting defects of devices and method of inspectin...
- Publication number 20040178811
- Publication date Sep 16, 2004
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Application
Refilling method by ion beam, instrument for fabrication and observ...
- Publication number 20030198755
- Publication date Oct 23, 2003
- Hiroyasu Shichi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Probe driving method, and probe apparatus
- Publication number 20030184332
- Publication date Oct 2, 2003
- Satoshi Tomimatsu
- G01 - MEASURING TESTING

Isamu Sekihara

Person

Patents Grantslast 30 patents

Charged particle beam device and sample preparation method

Charged particle beam device

Charged particle beam device, position specification method used fo...

Focused ion beam device and focused ion beam processing method

Charged particle beam apparatus, and sample processing and observat...

Sample inspection apparatus

Refilling method by ion beam, instrument for fabrication and observ...

Probe driving method, and probe apparatus

Apparatus for inspecting defects of devices and method of inspectin...

Probe driving method, and probe apparatus

Apparatus for detecting defect in device and method of detecting de...

Patents Applicationslast 30 patents

Charged Particle Beam Device and Sample Preparation Method

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS AND METHOD OF IRRADIATING CHARGED P...

CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...

Focused Ion Beam Device and Focused Ion Beam Processing Method

Charged Particle Beam Device, Position Specification Method Used fo...

SAMPLE INSPECTION APPARATUS

CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...

Probe driving method, and probe apparatus

Apparatus for inspecting defects of devices and method of inspectin...

Refilling method by ion beam, instrument for fabrication and observ...

Probe driving method, and probe apparatus