Isao Asaka

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
System and method for inspecting a semiconductor device with contac...
- Patent number 6,621,286
- Issue date Sep 16, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Takada
- G01 - MEASURING TESTING
Information Patent Grant
Contact terminal element, contact terminal device
- Patent number 6,384,470
- Issue date May 7, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kunio Kobayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Contact terminal element, contact terminal device, manufacture ther...
- Publication number 20020005569
- Publication date Jan 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kunio Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
System and method for inspecting semiconductor device
- Publication number 20010054710
- Publication date Dec 27, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Shigeru Takada
- G01 - MEASURING TESTING