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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for assembling optical module
Patent number
10,379,300
Issue date
Aug 13, 2019
Sumitomo Electric Device Innovations, Inc.
Yuji Gomi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Test apparatus
Patent number
9,279,848
Issue date
Mar 8, 2016
Sumitomo Electric Device Innovations, Inc.
Haruyoshi Ono
G01 - MEASURING TESTING
Information
Patent Grant
Testing method of semiconductor laser and laser testing device
Patent number
8,248,587
Issue date
Aug 21, 2012
Sumitomo Electric Device Innovations, Inc.
Haruyoshi Ono
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Laser module, control method of the same, control data of the same,...
Patent number
7,907,650
Issue date
Mar 15, 2011
Eudyna Devices Inc.
Haruyoshi Ono
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Device for and method of testing semiconductor laser module
Patent number
6,822,984
Issue date
Nov 23, 2004
Fujitsu Quantum Devices Limited
Haruyoshi Ono
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wavelength inspection method of a semiconductor laser diode and a w...
Patent number
6,807,199
Issue date
Oct 19, 2004
Fujitsu Quantum Devices Limited
Haruyoshi Ono
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Input protection device for C-MOS device
Patent number
4,872,045
Issue date
Oct 3, 1989
Tokyo Shibaura Denki Kabushiki Kaisha
Isao Baba
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR ASSEMBLING OPTICAL MODULE
Publication number
20180003907
Publication date
Jan 4, 2018
SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC.
Yuji Gomi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
TEST APPARATUS
Publication number
20150055131
Publication date
Feb 26, 2015
SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC.
Haruyoshi Ono
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING TESTING APPARATUS
Publication number
20110252860
Publication date
Oct 20, 2011
SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC.
Haruyoshi Ono
G01 - MEASURING TESTING
Information
Patent Application
LASER MODULE, CONTROL METHOD OF THE SAME, CONTROL DATA OF THE SAME,...
Publication number
20110158269
Publication date
Jun 30, 2011
EUDYNA DEVICES INC.
Haruyoshi Ono
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
TESTING METHOD OF SEMICONDUCTOR LASER AND LASER TESTING DEVICE
Publication number
20100238426
Publication date
Sep 23, 2010
SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC.
Haruyoshi Ono
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Laser module, control method of the same, control data of the same,...
Publication number
20060222025
Publication date
Oct 5, 2006
EUDYNA DEVICES INC.
Haruyoshi Ono
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Optical communication module and wavelength locker module
Publication number
20040008995
Publication date
Jan 15, 2004
FUJITSU QUANTUM DEVICES LIMITED
Haruyoshi Ono
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Wavelength inspection method of a semiconductor laser diode and a w...
Publication number
20030002546
Publication date
Jan 2, 2003
FUJITSU QUANTUM DEVICES LIMITED
Haruyoshi Ono
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Device for and method of testing semiconductor laser module
Publication number
20020172243
Publication date
Nov 21, 2002
FUJITSU QUANTUM DEVICES LIMITED
Haruyoshi Ono
H01 - BASIC ELECTRIC ELEMENTS