Isao Hayami

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 8,189,641
- Issue date May 29, 2012
- Panasonic Corporation
- Toshiyuki Fukuda
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic component tester
- Patent number 7,994,804
- Issue date Aug 9, 2011
- Panasonic Corporation
- Takanori Miya
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, method of manufacturing the same, and product...
- Patent number 7,852,900
- Issue date Dec 14, 2010
- Panasonic Corporation
- Isao Hayami
- G11 - INFORMATION STORAGE
Information Patent Grant
Device for testing a light-emitting optical device using a socket
- Patent number 7,501,617
- Issue date Mar 10, 2009
- Panasonic Corporation
- Isao Hayami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND FABRICATION METHOD FOR THE SAME
- Publication number 20100128750
- Publication date May 27, 2010
- Toshiyuki Fukuda
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC COMPONENT TESTER
- Publication number 20100127712
- Publication date May 27, 2010
- Takanori Miya
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, AND PRODUCT...
- Publication number 20090161712
- Publication date Jun 25, 2009
- Panasonic Corporation
- Isao Hayami
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device
- Publication number 20070274362
- Publication date Nov 29, 2007
- Matsushita Electric Industrial Co., Ltd.
- Isao Hayami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tester for optical device
- Publication number 20060208183
- Publication date Sep 21, 2006
- Matsushita Electric Industrial Co., Ltd.
- Isao Hayami
- G01 - MEASURING TESTING