Isao Kouno

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Nirasaki City, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe apparatus
- Patent number 9,658,285
- Issue date May 23, 2017
- Tokyo Electron Limited
- Isao Kouno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE APPARATUS
- Publication number 20130063171
- Publication date Mar 14, 2013
- TOKYO ELECTRON LIMITED
- Isao Kouno
- G01 - MEASURING TESTING