Isao Ochiai

Person

Hachioji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron microscope including apparatus for X-ray analysis and meth...
- Patent number 6,765,205
- Issue date Jul 20, 2004
- Hitachi High-Technologies Corporation
- Isao Ochiai
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector and charged-particle apparatus
- Patent number 6,653,637
- Issue date Nov 25, 2003
- Hitachi, Ltd.
- Isao Ochiai
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for observing sample using electron beam
- Patent number 6,627,889
- Issue date Sep 30, 2003
- Hitachi, Ltd.
- Isao Ochiai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor radiation detector and manufacture thereof
- Patent number 6,486,476
- Issue date Nov 26, 2002
- Hitachi, Ltd.
- Isao Ochiai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Parallel radiation detector
- Patent number 6,121,623
- Issue date Sep 19, 2000
- Hitachi, Ltd.
- Isao Ochiai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray exposure method with an X-ray mask comprising phase shifter s...
- Patent number 5,372,916
- Issue date Dec 13, 1994
- Hitachi, Ltd.
- Taro Ogawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged particle source of large current with high energy
- Patent number 4,987,345
- Issue date Jan 22, 1991
- U.S. Philips Corporation
- Hans-Peter Stormberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma X-ray source
- Patent number 4,841,556
- Issue date Jun 20, 1989
- Hitachi, Ltd.
- Yasuo Kato
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE INCLUDING APPARATUS FOR X-RAY ANALYSIS AND METH...
- Publication number 20040099805
- Publication date May 27, 2004
- Isao Ochiai
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for observing sample using electron beam
- Publication number 20030089852
- Publication date May 15, 2003
- Isao Ochiai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray detector and charged-patricle apparatus
- Publication number 20020100877
- Publication date Aug 1, 2002
- Isao Ochiai
- G01 - MEASURING TESTING

Isao Ochiai

Person

Patents Grantslast 30 patents

Electron microscope including apparatus for X-ray analysis and meth...

X-ray detector and charged-particle apparatus

Apparatus and method for observing sample using electron beam

Semiconductor radiation detector and manufacture thereof

Parallel radiation detector

X-ray exposure method with an X-ray mask comprising phase shifter s...

Charged particle source of large current with high energy

Plasma X-ray source

Patents Applicationslast 30 patents

ELECTRON MICROSCOPE INCLUDING APPARATUS FOR X-RAY ANALYSIS AND METH...

Apparatus and method for observing sample using electron beam

X-ray detector and charged-patricle apparatus