Isao Tanaka

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Tokai, JP

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Patents Grantslast 30 patents

Information Patent Grant
Non-destructive inspection method and apparatus therefor
- Patent number 7,462,827
- Issue date Dec 9, 2008
- Hitachi-GE Nuclear Energy, Ltd.
- Toshio Asano
- G01 - MEASURING TESTING
Information Patent Grant
Method for non-destructive inspection, apparatus thereof and digita...
- Patent number 7,272,253
- Issue date Sep 18, 2007
- Hitachi, Ltd.
- Daisuke Katsuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nondestructive inspection method and apparatus
- Patent number 7,215,807
- Issue date May 8, 2007
- Hitachi, Ltd.
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for non-destructive testing
- Patent number 6,975,391
- Issue date Dec 13, 2005
- Hitachi, Ltd.
- Toshio Asano
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspection method and apparatus
- Patent number 6,950,545
- Issue date Sep 27, 2005
- Hitachi, Ltd.
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Non-destructive inspection method and apparatus therefor
- Publication number 20060033986
- Publication date Feb 16, 2006
- Toshio Asano
- G01 - MEASURING TESTING
Information Patent Application
Nondestructive inspection method and apparatus
- Publication number 20050259861
- Publication date Nov 24, 2005
- Hitachi, Ltd
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of trading information
- Publication number 20040186740
- Publication date Sep 23, 2004
- Daisuke Katsuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for non-destructive inspection, apparatus thereof and digita...
- Publication number 20020154811
- Publication date Oct 24, 2002
- Hitachi, Ltd
- Daisuke Katsuta
- G01 - MEASURING TESTING