Isao YAGI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection apparatus and x-ray inspection method
- Patent number 10,989,674
- Issue date Apr 27, 2021
- Hitachi High-Tech Science Corporation
- Masaki Tatsumi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer and method of displaying sample thereof
- Patent number 9,829,447
- Issue date Nov 28, 2017
- Hitachi High-Tech Science Corporation
- Isao Yagi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer and measurement position adjusting meth...
- Patent number 9,791,392
- Issue date Oct 17, 2017
- Hitachi High-Tech Science Corporation
- Isao Yagi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 9,612,214
- Issue date Apr 4, 2017
- Hitachi High-Tech Science Corporation
- Haruo Takahashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Fluorescent X-ray coating thickness gauge
- Patent number D781424
- Issue date Mar 14, 2017
- Hitachi High-Tech Science Corporation
- Ai Masuda
- D24 - Medical and laboratory equipment
Information Patent Grant
Fluorescent X-ray coating thickness gauge
- Patent number D780927
- Issue date Mar 7, 2017
- Hitachi High-Tech Science Corporation
- Ai Masuda
- D24 - Medical and laboratory equipment

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
- Publication number 20200284738
- Publication date Sep 10, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masaki Tatsumi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND MEASUREMENT POSITION ADJUSTING METH...
- Publication number 20160069827
- Publication date Mar 10, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Isao YAGI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND METHOD OF DISPLAYING SAMPLE THEREOF
- Publication number 20160061753
- Publication date Mar 3, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Isao YAGI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20150362445
- Publication date Dec 17, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Haruo TAKAHASHI
- G01 - MEASURING TESTING