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Isao Yamazaki

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,994,529
    • Issue date May 28, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Shinji Azuma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Display device, information terminal, personal information protecti...
    • Patent number 11,947,703
    • Issue date Apr 2, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Masaharu Nishida
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Test method and dispensing device
    • Patent number 11,879,902
    • Issue date Jan 23, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Nojima
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Enriching DHA in glyceride fractions
    • Patent number 11,840,714
    • Issue date Dec 12, 2023
    • NISSUI CORPORATION
    • Yuuji Hirouchi
    • C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
  • Information Patent Grant

    Test kit, test method, dispensing device
    • Patent number 11,788,971
    • Issue date Oct 17, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Nojima
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,662,358
    • Issue date May 30, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Shinji Azuma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,506,534
    • Issue date Nov 22, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takeshi Ishida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ultrasonic cleaner and automatic analyzer using the same
    • Patent number 11,389,838
    • Issue date Jul 19, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke Horie
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analyzer and probe washing method
    • Patent number 11,366,132
    • Issue date Jun 21, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takamichi Mori
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,327,089
    • Issue date May 10, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Masafumi Shimada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,293,934
    • Issue date Apr 5, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takeshi Ishida
    • C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,169,166
    • Issue date Nov 9, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hideto Tamezane
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,162,965
    • Issue date Nov 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Shinji Azuma
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,143,665
    • Issue date Oct 12, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ultrasonic cleaner and automatic analyzer using the same
    • Patent number 10,786,835
    • Issue date Sep 29, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke Horie
    • B08 - CLEANING
  • Information Patent Grant

    Sample dispensing apparatus and automatic analyzer including the same
    • Patent number 10,309,979
    • Issue date Jun 4, 2019
    • Hitachi High-Technologies Corporation
    • Hideyuki Yanami
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,288,637
    • Issue date May 14, 2019
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,113,962
    • Issue date Oct 30, 2018
    • Hitachi High-Technologies Corporation
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,067,152
    • Issue date Sep 4, 2018
    • Hitachi High-Technologies Corporation
    • Masaru Miyazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,897,624
    • Issue date Feb 20, 2018
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,857,388
    • Issue date Jan 2, 2018
    • Hitachi High-Technologies Corporation
    • Hideto Tamezane
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample dispensing apparatus and automatic analyzer including the same
    • Patent number 9,817,013
    • Issue date Nov 14, 2017
    • Hitachi High-Technologies Corporation
    • Hideyuki Yanami
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,599,631
    • Issue date Mar 21, 2017
    • Hitachi High-Technologies Corporation
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and method for determining malfunction thereof
    • Patent number 9,470,570
    • Issue date Oct 18, 2016
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,389,240
    • Issue date Jul 12, 2016
    • Hitachi High-Technologies Corporation
    • Kenichi Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,335,335
    • Issue date May 10, 2016
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample analysis device
    • Patent number 9,194,793
    • Issue date Nov 24, 2015
    • Hitachi High-Technologies Corporation
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,039,970
    • Issue date May 26, 2015
    • Hitachi High-Technologies Corporation
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,023,282
    • Issue date May 5, 2015
    • Hitachi High-Technologies Corporation
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 8,936,754
    • Issue date Jan 20, 2015
    • Hitachi High-Technologies Corporation
    • Isao Yamazaki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Automatic Analyzer
    • Publication number 20230251280
    • Publication date Aug 10, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Shinji AZUMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF PRODUCING HIGHLY UNSATURATED FATTY ACID CONTAINING GLYCER...
    • Publication number 20220106617
    • Publication date Apr 7, 2022
    • Nippon Suisan Kaisha, Ltd.
    • Yuuji HIROUCHI
    • C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220018869
    • Publication date Jan 20, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Shinji AZUMA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    METHOD OF PRODUCING DOCOSAHEXAENOIC ACID CONTAINING GLYCERIDE USING...
    • Publication number 20210324432
    • Publication date Oct 21, 2021
    • NIPPON SUISAN KAISHA, LTD.
    • Yuuji HIROUCHI
    • C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
  • Information Patent Application

    TEST METHOD AND DISPENSING DEVICE
    • Publication number 20210318344
    • Publication date Oct 14, 2021
    • Hitachi High-Tech Corporation
    • Akihiro Nojima
    • G01 - MEASURING TESTING
  • Information Patent Application

    Display Device, Information Terminal, Personal Information Protecti...
    • Publication number 20210312079
    • Publication date Oct 7, 2021
    • Hitachi High-Tech Corporation
    • Masaharu NISHIDA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    FLUORESCENT BODY, LIGHT SOURCE, AND BIOCHEMICAL ANALYZER
    • Publication number 20210253949
    • Publication date Aug 19, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Masaaki KOMATSU
    • C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
  • Information Patent Application

    Test Kit, Test Method, Dispensing Device
    • Publication number 20210140894
    • Publication date May 13, 2021
    • Hitachi High-Technologies Corporation
    • Akihiro NOJIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ULTRASONIC CLEANER AND AUTOMATIC ANALYZER USING THE SAME
    • Publication number 20210053094
    • Publication date Feb 25, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke HORIE
    • B08 - CLEANING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20200378997
    • Publication date Dec 3, 2020
    • Shinji AZUMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND PROBE WASHING METHOD
    • Publication number 20200348325
    • Publication date Nov 5, 2020
    • Hitachi High-Technologies Corporation
    • Takamichi MORI
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200041530
    • Publication date Feb 6, 2020
    • Hitachi High-Technologies Corporation
    • Masafumi SHIMADA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190361042
    • Publication date Nov 28, 2019
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20190316963
    • Publication date Oct 17, 2019
    • Hitachi High-Technologies Corporation
    • Takeshi ISHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20190310275
    • Publication date Oct 10, 2019
    • Hitachi High-Technologies Corporation
    • Takeshi ISHIDA
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Application

    ULTRASONIC CLEANER AND AUTOMATIC ANALYZER USING THE SAME
    • Publication number 20180161829
    • Publication date Jun 14, 2018
    • Hitachi High-Technologies Corporation
    • Yosuke HORIE
    • B08 - CLEANING
  • Information Patent Application

    SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
    • Publication number 20180038882
    • Publication date Feb 8, 2018
    • Hitachi High-Technologies Corporation
    • Hideyuki YANAMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSER
    • Publication number 20180031589
    • Publication date Feb 1, 2018
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    REACTION CELL FOR AUTOMATIC ANALYSIS DEVICE, AUTOMATIC ANALYSIS DEV...
    • Publication number 20170199115
    • Publication date Jul 13, 2017
    • Hitachi High-Technologies Corporation
    • Masayuki KOBAYASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170089938
    • Publication date Mar 30, 2017
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160334432
    • Publication date Nov 17, 2016
    • Hitachi High-Technologies Corporation
    • Masaru MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150362514
    • Publication date Dec 17, 2015
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150323557
    • Publication date Nov 12, 2015
    • Hitachi High-Technologies Corporation
    • Hideto TAMEZANE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150219680
    • Publication date Aug 6, 2015
    • Hitachi High-Technologies Corporation
    • Tomonori Mimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150198525
    • Publication date Jul 16, 2015
    • Hitachi High-Technologies Corporation
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140377853
    • Publication date Dec 25, 2014
    • Sakuichiro Adachi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140220693
    • Publication date Aug 7, 2014
    • Hitachi High-Technologies Corporation
    • Isao Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140193918
    • Publication date Jul 10, 2014
    • Hitachi High-Technologies Corporation
    • Kenichi Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR DETERMINING MALFUNCTION THEREOF
    • Publication number 20140190253
    • Publication date Jul 10, 2014
    • Hitachi High-Technologies Corporation
    • Masaharu Nishida
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
    • Publication number 20140170022
    • Publication date Jun 19, 2014
    • Hitachi High-Technologies Corporation
    • Hideyuki YANAMI
    • G01 - MEASURING TESTING