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Isao Yonekura
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Kuki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Defect inspection apparatus and method using a plurality of detecto...
Patent number
9,236,218
Issue date
Jan 12, 2016
Toppan Printing Co., Ltd.
Tsutomu Murakawa
G01 - MEASURING TESTING
Information
Patent Grant
Defect review apparatus and defect review method
Patent number
8,779,359
Issue date
Jul 15, 2014
Advantest Corp.
Yoshiaki Ogiso
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Microstructure inspection method, microstructure inspection apparat...
Patent number
8,754,935
Issue date
Jun 17, 2014
Toppan Printing Co., Ltd.
Isao Yonekura
G01 - MEASURING TESTING
Information
Patent Grant
Pattern-height measuring apparatus and pattern-height measuring method
Patent number
8,604,431
Issue date
Dec 10, 2013
Advantest Corp.
Tsutomu Murakawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20140312225
Publication date
Oct 23, 2014
Advantest Corporation
Tsutomu Murakawa
G01 - MEASURING TESTING
Information
Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
Publication number
20140312224
Publication date
Oct 23, 2014
Advantest Corporation
Tsutomu Murakawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PATTERN MEASUREMENT METHOD AND PATTERN MEASUREMENT APPARATUS
Publication number
20130264480
Publication date
Oct 10, 2013
Toppan Printing Co., Ltd.
Tsutomu Murakawa
G01 - MEASURING TESTING
Information
Patent Application
PATTERN MEASUREMENT APPARATUS AND PATTERN MEASUREMENT METHOD
Publication number
20120318976
Publication date
Dec 20, 2012
Jun Matsumoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PATTERN-HEIGHT MEASURING APPARATUS AND PATTERN-HEIGHT MEASURING METHOD
Publication number
20120217392
Publication date
Aug 30, 2012
Tsutomu Murakawa
G01 - MEASURING TESTING
Information
Patent Application
Defect review apparatus and defect review method
Publication number
20120112066
Publication date
May 10, 2012
Yoshiaki Ogiso
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MICROSTRUCTURE INSPECTION METHOD, MICROSTRUCTURE INSPECTION APPARAT...
Publication number
20110001816
Publication date
Jan 6, 2011
Toppan Printing Co., Ltd.
Isao Yonekura
G06 - COMPUTING CALCULATING COUNTING