Isao YOSHIDA

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Iwaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Eddy current inspection device
- Patent number 10,132,779
- Issue date Nov 20, 2018
- Hitachi - GE Nuclear Energy, Ltd.
- Masahiro Miki
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current flaw detection system and eddy current flaw detection...
- Patent number 9,222,915
- Issue date Dec 29, 2015
- Hitachi - GE Nuclear Energy, Ltd.
- Akira Nishimizu
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic inspection system and ultrasonic inspection method
- Patent number 8,616,062
- Issue date Dec 31, 2013
- Hitachi-GE Nuclear Energy, Ltd.
- Naoyuki Kono
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating length of defect in eddy curren...
- Patent number 8,339,130
- Issue date Dec 25, 2012
- Hitachi, Ltd.
- Akira Nishimizu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating length of defect in eddy curren...
- Patent number 7,911,206
- Issue date Mar 22, 2011
- Hitachi, Ltd.
- Akira Nishimizu
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current testing probe and eddy current testing apparatus
- Patent number 7,235,967
- Issue date Jun 26, 2007
- Hitachi, Ltd.
- Akira Nishimizu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Eddy Current Inspection Device
- Publication number 20160356743
- Publication date Dec 8, 2016
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Masahiro MIKI
- G01 - MEASURING TESTING
Information Patent Application
Eddy Current Flaw Detection System and Eddy Current Flaw Detection...
- Publication number 20130193960
- Publication date Aug 1, 2013
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Akira NISHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
ULTRASONIC INSPECTION SYSTEM AND ULTRASONIC INSPECTION METHOD
- Publication number 20110197679
- Publication date Aug 18, 2011
- HITACHI-GE NUCLEAR ENERGY, LTD.
- Naoyuki KONO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING LENGTH OF DEFECT IN EDDY CURREN...
- Publication number 20110148404
- Publication date Jun 23, 2011
- Akira NISHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING LENGTH OF DEFECT IN EDDY CURREN...
- Publication number 20080004817
- Publication date Jan 3, 2008
- Akira NISHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
Eddy current testing probe and eddy current testing apparatus
- Publication number 20060170420
- Publication date Aug 3, 2006
- Akira Nishimizu
- G01 - MEASURING TESTING