Ishai Schwarzband

Person

Or-Yehuda, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Determining a critical dimension variation of a pattern
- Patent number 11,756,188
- Issue date Sep 12, 2023
- Applied Materials Israel Ltd.
- Vadim Vereschagin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, system and computer program product for 3D-NAND CDSEM metro...
- Patent number 11,651,509
- Issue date May 16, 2023
- Applied Materials Israel Ltd.
- Roman Kris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring height difference in patterns on semiconductor wafers
- Patent number 11,301,983
- Issue date Apr 12, 2022
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining a critical dimension variation of a pattern
- Patent number 11,276,160
- Issue date Mar 15, 2022
- Applied Materials Israel Ltd.
- Vadim Vereschagin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring height difference in patterns on semiconductor wafers
- Patent number 10,748,272
- Issue date Aug 18, 2020
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for monitoring nanometric structures
- Patent number 10,731,979
- Issue date Aug 4, 2020
- Applied Materials Israel Ltd.
- Shimon Levi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Technique for inspecting semiconductor wafers
- Patent number 10,636,140
- Issue date Apr 28, 2020
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Evaluating an object
- Patent number 10,504,693
- Issue date Dec 10, 2019
- Applied Materials Israel Ltd.
- Shay Attal
- G01 - MEASURING TESTING
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 10,354,376
- Issue date Jul 16, 2019
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging low electron yield regions with a charged beam imager
- Patent number 10,103,005
- Issue date Oct 16, 2018
- Applied Materials Israel Ltd.
- Yuval Gronau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 9,916,652
- Issue date Mar 13, 2018
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect classification using CAD-based context attributes
- Patent number 9,858,658
- Issue date Jan 2, 2018
- Applied Materials Israel Ltd.
- Idan Kaizerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
CD-SEM technique for wafers fabrication control
- Patent number 9,824,852
- Issue date Nov 21, 2017
- Applied Materials Israel Ltd.
- Roman Kris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Registration of CAD data with SEM images
- Patent number 9,715,724
- Issue date Jul 25, 2017
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique for visualizing elements in images by color coding
- Patent number 9,674,536
- Issue date Jun 6, 2017
- Applied Materials Israel, Ltd.
- Yakov Weinberg
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect classification using topographical attributes
- Patent number 9,595,091
- Issue date Mar 14, 2017
- Applied Materials Israel, Ltd.
- Idan Kaizerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Technique for measuring overlay between layers of a multilayer stru...
- Patent number 9,530,199
- Issue date Dec 27, 2016
- Applied Materials Israel Ltd.
- Yakov Weinberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for scanning an object
- Patent number 9,490,101
- Issue date Nov 8, 2016
- Applied Materials Israel Ltd.
- Yuval Gronau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional mapping using scanning electron microscope images
- Patent number 9,378,923
- Issue date Jun 28, 2016
- Applied Materials Israel, Ltd.
- Ishai Schwarzband
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional mapping using scanning electron microscope images
- Patent number 8,946,627
- Issue date Feb 3, 2015
- Applied Materials Israel, Ltd.
- Ishai Schwarzband
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional mapping using scanning electron microscope images
- Patent number 8,604,427
- Issue date Dec 10, 2013
- Applied Materials Israel, Ltd.
- Ishai Schwarzband
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for aerial imaging of a reticle
- Patent number 8,213,024
- Issue date Jul 3, 2012
- Applied Materials Israel, Ltd.
- Shmuel Mangan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for evaluating an evaluated pattern of a mask
- Patent number 8,098,926
- Issue date Jan 17, 2012
- Applied Materials Israel, Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for simulating an aerial image
- Patent number 7,310,796
- Issue date Dec 18, 2007
- Applied Materials, Israel, Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN
- Publication number 20220198639
- Publication date Jun 23, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Vadim VERESCHAGIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR 3D-NAND CDSEM METRO...
- Publication number 20210383529
- Publication date Dec 9, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS
- Publication number 20200380668
- Publication date Dec 3, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN
- Publication number 20200327652
- Publication date Oct 15, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Vadim VERESCHAGIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MONITORING NANOMETRIC STRUCTURES
- Publication number 20190219390
- Publication date Jul 18, 2019
- APPLIED MATERIALS ISRAEL, LTD.
- Shimon LEVI
- B82 - NANO-TECHNOLOGY
Information Patent Application
EVALUATING AN OBJECT
- Publication number 20190088444
- Publication date Mar 21, 2019
- APPLIED MATERIALS ISRAEL, LTD.
- Shay Attal
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUE FOR INSPECTING SEMICONDUCTOR WAFERS
- Publication number 20180336671
- Publication date Nov 22, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS
- Publication number 20180336675
- Publication date Nov 22, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20180268539
- Publication date Sep 20, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20170243343
- Publication date Aug 24, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CD-SEM TECHNIQUE FOR WAFERS FABRICATION CONTROL
- Publication number 20170194125
- Publication date Jul 6, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...
- Publication number 20170018066
- Publication date Jan 19, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yakov WEINBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING LOW ELECTRON YIELD REGIONS WITH A CHARGED BEAM IMAGER
- Publication number 20170011881
- Publication date Jan 12, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yuval GRONAU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SCANNING AN OBJECT
- Publication number 20160276127
- Publication date Sep 22, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Yuval Gronau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REGISTRATION OF CAD DATA WITH SEM IMAGES
- Publication number 20160035076
- Publication date Feb 4, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES
- Publication number 20150136960
- Publication date May 21, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Ishai Schwarzband
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES
- Publication number 20140074419
- Publication date Mar 13, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Ishai Schwarzband
- G01 - MEASURING TESTING
Information Patent Application
DEFECT CLASSIFICATION USING CAD-BASED CONTEXT ATTRIBUTES
- Publication number 20130279790
- Publication date Oct 24, 2013
- APPLIED MATERIALS ISRAEL LTD.
- Idan Kaizerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CLASSIFICATION USING TOPOGRAPHICAL ATTRIBUTES
- Publication number 20130279791
- Publication date Oct 24, 2013
- APPLIED MATERIALS ISRAEL LTD.
- Idan Kaizerman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES
- Publication number 20130200255
- Publication date Aug 8, 2013
- APPLIED MATERIALS ISRAEL, LTD.
- Ishai Schwarzband
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING AN EVALUATED PATTERN OF A MASK
- Publication number 20080166038
- Publication date Jul 10, 2008
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR DEFECT DETECTION
- Publication number 20080074659
- Publication date Mar 27, 2008
- Shmuel Mangan
- G01 - MEASURING TESTING
Information Patent Application
System and method for simulating an aerial image
- Publication number 20060048089
- Publication date Mar 2, 2006
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Bidirectional signal repeater
- Publication number 20020080865
- Publication date Jun 27, 2002
- Ishai Schwarzband
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Ishai Schwarzband

Person

Patents Grantslast 30 patents

Determining a critical dimension variation of a pattern

Method, system and computer program product for 3D-NAND CDSEM metro...

Measuring height difference in patterns on semiconductor wafers

Determining a critical dimension variation of a pattern

Measuring height difference in patterns on semiconductor wafers

Method for monitoring nanometric structures

Technique for inspecting semiconductor wafers

Evaluating an object

Technique for measuring overlay between layers of a multilayer stru...

Imaging low electron yield regions with a charged beam imager

Technique for measuring overlay between layers of a multilayer stru...

Defect classification using CAD-based context attributes

CD-SEM technique for wafers fabrication control

Registration of CAD data with SEM images

Technique for visualizing elements in images by color coding

Defect classification using topographical attributes

Technique for measuring overlay between layers of a multilayer stru...

System and method for scanning an object

Three-dimensional mapping using scanning electron microscope images

Three-dimensional mapping using scanning electron microscope images

Three-dimensional mapping using scanning electron microscope images

Method and system for aerial imaging of a reticle

Method and system for evaluating an evaluated pattern of a mask

System and method for simulating an aerial image

Patents Applicationslast 30 patents

DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN

METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR 3D-NAND CDSEM METRO...

MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS

DETERMINING A CRITICAL DIMENSION VARIATION OF A PATTERN

METHOD FOR MONITORING NANOMETRIC STRUCTURES

EVALUATING AN OBJECT

TECHNIQUE FOR INSPECTING SEMICONDUCTOR WAFERS

MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

CD-SEM TECHNIQUE FOR WAFERS FABRICATION CONTROL

TECHNIQUE FOR MEASURING OVERLAY BETWEEN LAYERS OF A MULTILAYER STRU...

IMAGING LOW ELECTRON YIELD REGIONS WITH A CHARGED BEAM IMAGER

SYSTEM AND METHOD FOR SCANNING AN OBJECT

REGISTRATION OF CAD DATA WITH SEM IMAGES

THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES

THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES

DEFECT CLASSIFICATION USING CAD-BASED CONTEXT ATTRIBUTES

DEFECT CLASSIFICATION USING TOPOGRAPHICAL ATTRIBUTES

THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES

METHOD AND SYSTEM FOR EVALUATING AN EVALUATED PATTERN OF A MASK

METHOD AND SYSTEM FOR DEFECT DETECTION

System and method for simulating an aerial image

Bidirectional signal repeater