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Ishwara B. BHAT
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Clifton Park, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Radiation-detecting structures and fabrication methods thereof
Patent number
11,677,041
Issue date
Jun 13, 2023
Rensselaer Polytechnic Institute
Rajendra P. Dahal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Selective, electrochemical etching of a semiconductor
Patent number
9,922,838
Issue date
Mar 20, 2018
Rensselaer Polytechnic Institute
Rajendra P. Dahal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fabricating radiation-detecting structures
Patent number
9,810,794
Issue date
Nov 7, 2017
Rensselaer Polytechnic Institute
Rajendra P. Dahal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capacitance reduction for pillar structured devices
Patent number
9,645,262
Issue date
May 9, 2017
Lawrence Livermore National Security, LLC
Qinghui Shao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Neutron-detecting apparatuses and methods of fabrication
Patent number
9,406,833
Issue date
Aug 2, 2016
Rensselaer Polytechnic Institute
Rajendra P. Dahal
G01 - MEASURING TESTING
Information
Patent Grant
Neutron-detecting apparatuses and methods of fabrication
Patent number
9,151,853
Issue date
Oct 6, 2015
Rensselaer Polytechnic Institute
Rajendra P. Dahal
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SELECTIVE, ELECTROCHEMICAL ETCHING OF A SEMICONDUCTOR
Publication number
20170170025
Publication date
Jun 15, 2017
Rensselaer Polytechnic Institute
Rajendra P. DAHAL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FABRICATING RADIATION-DETECTING STRUCTURES
Publication number
20170139060
Publication date
May 18, 2017
Rensselaer Polytechnic Institute
Rajendra P. DAHAL
G01 - MEASURING TESTING
Information
Patent Application
RADIATION-DETECTING STRUCTURES AND FABRICATION METHODS THEREOF
Publication number
20170133543
Publication date
May 11, 2017
Rensselaer Polytechnic Institute
Rajendra P. DAHAL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CAPACITANCE REDUCTION FOR PILLAR STRUCTURED DEVICES
Publication number
20160356901
Publication date
Dec 8, 2016
LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
Qinghui Shao
G01 - MEASURING TESTING
Information
Patent Application
NEUTRON-DETECTING APPARATUSES AND METHODS OF FABRICATION
Publication number
20150380593
Publication date
Dec 31, 2015
Rensselaer Polytechnic Institute
Rajendra P. DAHAL
G01 - MEASURING TESTING
Information
Patent Application
NEUTRON-DETECTING APPARATUSES AND METHODS OF FABRICATION
Publication number
20140252520
Publication date
Sep 11, 2014
Rensselaer Polytechnic Institute
Rajendra P. DAHAL
G01 - MEASURING TESTING
Information
Patent Application
Material for selective deposition and etching
Publication number
20060211210
Publication date
Sep 21, 2006
Rensselaer Polytechnic Institute
Ishwara Bhat
H01 - BASIC ELECTRIC ELEMENTS